Methods And Systems For Detecting A Chemical Species

ABSTRACT

Methods and systems for detecting at least one chemical species including obtaining a first image from a first electromagnetic radiation detector and obtaining a second image from a second electromagnetic radiation detector. The first image includes a first plurality of pixels and the second image includes a second plurality of pixels, each pixel having an associated intensity value. A first resultant image is generated. The first resultant image includes a plurality of resultant pixels, each pixel having an associated intensity value. One or more regions of interest are determined. The correlation between the first image, the second image, and the first resultant image is determined for the one or more regions of interest using a correlation coefficient algorithm to calculate a first correlation coefficient and a second correlation coefficient. The presence of the chemical species is determined based, at least in part, on the first correlation coefficient and the second correlation coefficient.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation of U.S. application Ser. No.14/727,514, filed Jun. 1, 2015, entitled METHODS AND SYSTEMS FORDETECTING A CHEMICAL SPECIEIS, which claims the benefit of U.S.Provisional Application No. 62/015,920, filed Jun. 23, 2014, entitledMETHODS AND SYSTEMS FOR DETECTING A CHEMICAL SPECIES, the entirety ofwhich is incorporated by reference herein.

FIELD

The present disclosure relates to systems and methods for detecting achemical species using multiple detectors. In particular, at least achemical band detector and a reference band detector may be used togenerate images used to identify the presence of a chemical species.

BACKGROUND

This section is intended to introduce various aspects of the art, whichmay be associated with one or more embodiments of the presentdisclosure. This discussion is believed to assist in providing aframework to facilitate a better understanding of particular aspects ofthe present disclosure. Accordingly, it should be understood that thissection should be read in this light, and not necessarily as admissionsof prior art.

Chemical usage is a fundamental aspect of current civilization.Facilities for the production, processing, transportation, and use ofchemical species continue to be built in locations around the world.Thus, detection of chemical species is a continuing focus.

An example of chemical species detection is gaseous leak detection. Asthe efficiency of facilities becomes increasingly important, even minorlosses of chemical species such as hydrocarbons can add to cost orcreate issues for regulatory agencies.

Hydrocarbons in facilities may be lost due to process limitations orprocess upsets leading to flaring or leaks. While some of these issuescan be directly improved by design, leaks still provide a challenge, asthey may occur on any number of different process equipment types. Forexample, leaks can originate from pipe flanges, valves, valve stems,sampling systems, and any number of other locations. As equipment isused and ages, leaks become increasing probable.

Conditions within a facility can increase the probability of leakage orexacerbate leaks when they do form. For example, facilities using highpressures or cryogenic temperatures can increase the probability ofleaks. LNG plants are an example of such facility conditions. The numberof LNG liquefaction plants around the world is growing rapidly and asthese plants age, there is the increasing potential for hydrocarbonleaks to develop.

Early detection and repair of leaks can be useful in preventing anynumber of issues, such as increased costs and regulatory issues. Leaksmay be detected by operators, for example, by visually observing therelease, smelling the hydrocarbons, or hearing noise caused by therelease. However, most hydrocarbon vapors are not visible to the nakedeye. Further, there is often a high level of equipment congestion inplants, which may place a leak point behind another piece of equipment.In addition, hydrocarbons may have a minimal odor and, thus, may not bedetected by smell. Detecting a small leak by sound is more improbable,as the very high level of ambient noise and safety equipment such asearplugs makes it unlikely that the leak will be heard.

Leak detection systems have been installed in many facilities. One suchsystem may include combustible gas detectors that monitor theconcentration or lower explosive limit (LEL) of hydrocarbon vapors at aparticular location, providing a measurement of a hydrocarbon level at apoint in an area. An array of point measurement systems may then be usedto track a vapor release across the area. However, point detectionsystems may not detect small releases, such as from small leaks or newleaks, the amount of hydrocarbons released, and the like.

Another leak detection system that has been used utilizes a detectionmethod that detects hydrocarbons in a line across a plant environment,for example, by directing a light source at one edge of an area towardsa spectroscopic detector at another edge of the area. While such systemsmay be useful for monitoring compliance for regulatory issues, they donot necessarily identify a location of a release along the line.Further, they may not detect small releases at all for the same reasonsas the point detectors, e.g., the hydrocarbons may be too dilute todetect or may be blown away from the detection line by the wind.

Another leak detection system has been described that can detectreleases by imaging areas using cameras which can directly show an imageof a hydrocarbon plume. One such system is described in Hackwell, J. A.,et al., “LWIR/MWIR Hyperspectral Sensor for Airborne and Ground-basedRemote Sensing,” Proceedings of the SPIE, Imaging Spectroscopy II, M. R.Descour, and J. M. Mooney, Eds., Vol. 2819, pp. 102-107 (1996). Thesystem was named a spatially-enhanced broadband array spectrographsystem (SEBASS). The SEBASS system was intended to explore the utilityof hyperspectral infrared sensors for remotely identifying solids,liquids, and gases in a 2 to 14 micrometer spectral region often used toprovide a chemical fingerprint. The SEBASS system allows the imaging andidentification of chemical materials, such as hydrocarbon plumes, in anenvironment.

In a presentation entitled “The Third Generation LDAR (LDAR3) LowerFugitive Emissions at a Lower Cost” (presented at the 2006 EnvironmentalConference of the National Petrochemical & Refiners Association, Sep.18-19, 2006), Zeng, et al., discloses an autonomous system for leakdetection that uses a camera to identify leaks in a particular area of aplant. Infrared (IR) video images from the camera are processed usingsoftware to minimize background and noise interference and the likelyvolatile organic compound (VOC) plumes are isolated using an algorithm.A plume index (PI) is calculated based on the number and intensity ofpixels in the processed VOC plume image. If the PI is greater than anexperimentally determined threshold value, an action can be triggered,such as an alarm or a video capture, for confirmation.

Another such system is described in WO2012/134796. The apparatusdescribed therein includes multiple detectors configured to addresscomplex interferences, such as moving equipment, people, vehicles orsteam, which can lead to false detections with a single detector system.

While the existing systems attempt to minimize background and noiseinterference, there is still a desire to obtain improved images for moreaccurate detection of chemical species.

SUMMARY

This summary is meant to provide an introduction of the variousembodiments further described herein and is not meant to limit the scopeof claimed subject matter.

The present disclosure relates to a method of detecting at least onechemical species using a detection system including multipleelectromagnetic (EM) detectors. The method includes obtaining at least afirst image from a first electromagnetic radiation detector of thedetection system. The first image includes a first plurality of pixels,each pixel having an associated intensity value. At least a second imageis obtained from a second electromagnetic radiation detector of thedetection system. The second image includes a second plurality ofpixels, each pixel having an associated intensity value. At least afirst resultant image is generated. The first resultant image includes aplurality of resultant pixels, each pixel having an associated intensityvalue. One or more regions of interest are determined based, at least inpart, on the first resultant image. The correlation between the firstimage, the second image, and the first resultant image for the one ormore regions of interest are determined using a correlation coefficientalgorithm. The correlation coefficient algorithm is configured to:calculate a first correlation coefficient using the intensity values ofa first subset of pixels from the first plurality of pixels and acorresponding subset of resultant pixels from the plurality of resultantpixels within at least one of the one or more regions of interest; andcalculate a second correlation coefficient using the intensity values ofa first subset of pixels from the second plurality of pixels and thecorresponding subset of resultant pixels from the plurality of resultantpixels within the corresponding region of interest. In one or moreembodiments, the correlation coefficient algorithm may be configured toalso calculate a third correlation coefficient using the intensityvalues of the first subset of pixels from the first plurality of pixelsand the first subset of pixels from the second plurality of pixelswithin the corresponding region of interest. The presence of at leastone chemical species is determined based, at least in part, on the firstcorrelation coefficient and the second correlation coefficient, andoptionally the third correlation coefficient.

In another aspect, the present disclosure relates to a system fordetecting at least one chemical species comprising: a lens; a beamsplitter; a first bandpass filter, a second bandpass filter, a firstelectromagnetic radiation detector, a second electromagnetic radiationdetector; and an analysis system. The analysis system includes codewithin a processor, a non-transitory, computer-readable medium, and acombination thereof. The code is configured to direct the processor to:identify at least a first image from the first electromagnetic radiationdetector, the first image including a first plurality of pixels, eachpixel having an associated intensity value; identify at least a secondimage from the second electromagnetic radiation detector, the secondimage including a second plurality of pixels, each pixel having anassociated intensity value; generate at least a first resultant image,the first resultant image including a plurality of resultant pixels,each pixel having an associated intensity value; determine one or moreregions of interest based, at least in part, on the first resultantimage; generate correlation coefficients for at least one of the one ormore regions of interest; and determine the presence of at least onechemical species based, at least in part, on a first correlationcoefficient and a second correlation coefficient. The first correlationcoefficient is calculated by using the intensity values of a firstsubset of pixels from the first plurality of pixels and a correspondingsubset of resultant pixels from the plurality of resultant pixels withinat least one of the one or more regions of interest. The secondcorrelation coefficient is calculated by using the intensity values of afirst subset of pixels from the second plurality of pixels and thecorresponding subset of resultant pixels from the plurality of resultantpixels within the corresponding region of interest. In one or moreembodiments, a third correlation coefficient may be generated and thepresence of the at least one chemical species also determined based onthe third correlation coefficient. The third correlation coefficient maybe calculated by using the intensity values of the first subset ofpixels from the first plurality of pixels and the first subset of pixelsfrom the second plurality of pixels within the corresponding region ofinterest.

In yet another aspect, the present disclosure relates to a method ofdetecting at least one chemical species. The method including obtainingat least a first image from a first electromagnetic radiation detectorand obtaining at least a second image from a second electromagneticradiation detector. At least a first resultant image is generated fromthe first image and the second image. The presence of at least onechemical species is determined based, at least in part, on the firstresultant image. The first resultant image is generated by the ratio ofintensity values between a plurality of pixels n₁ to n_(z) of the firstimage and the corresponding plurality of pixels m₁ to m_(z) of thesecond image, using each of the ratio of the intensity values as anintensity value for resultant pixels r₁ to r_(z) of the first resultantimage, wherein pixels n₁ to n_(z), pixels m₁ to m_(z), and resultantpixels r₁ to r_(z) substantially correspond spatially and temporally.

Other aspects of the present disclosure will be apparent from thefollowing description and the appended claims.

BRIEF DESCRIPTION OF THE DRAWINGS

The foregoing and other advantages of the present disclosure may becomeapparent upon reading the following detailed description and uponreference to the drawings, in which:

FIG. 1 illustrates a detection system in accordance with one or moreembodiments of the present disclosure.

FIG. 2 illustrates a calibration system for calibrating the detectionsystem in accordance with or more embodiments of the present disclosure.

FIG. 3 illustrates a flow chart for a method of calibrating multiple EMradiation detectors within a system in accordance with one or moreembodiments of the present disclosure.

FIGS. 4A and 4B illustrate histograms of pixel intensities of imagesfrom a multiple detector system according to one or more embodiments ofthe present disclosure.

FIG. 5 illustrates a flow chart for a method of enhancing image qualityof a detection system including multiple EM radiation detectors inaccordance with one or more embodiments of the present disclosure.

FIG. 6 illustrates an image from a chemical band EM radiation detectoras well as an image from a reference band EM radiation detector and aresultant image in accordance with one or more embodiments of thepresent disclosure.

FIG. 7 illustrates a flow chart for a method of detecting a chemicalspecies in accordance with one or more embodiments of the presentdisclosure.

FIG. 8 illustrates a decision matrix which may be used in the detectionof a chemical species in accordance with one or more embodiments of thepresent disclosure.

DETAILED DESCRIPTION

In the following detailed description section, the specific embodimentsof the present disclosure are described in connection with one or moreembodiments. However, to the extent that the following description isspecific to a particular embodiment or a particular use of the presentdisclosure, this is intended to be for exemplary purposes only andsimply provides a description of the one or more embodiments.Accordingly, the disclosure is not limited to the specific embodimentsdescribed below, but rather, it includes all alternatives,modifications, and equivalents falling within the true spirit and scopeof the appended claims.

Various terms as used herein are defined below. To the extent a termused in a claim is not defined below, it should be given the broadestdefinition persons in the pertinent art have given that term asreflected in at least one printed publication or issued patent.

Certain terms are used throughout the following description and claimsto refer to particular features or components. As one skilled in the artwould appreciate, different persons may refer to the same feature orcomponent by different names. This document does not intend todistinguish between components or features that differ in name only. Thedrawing figures are not necessarily to scale. Certain features andcomponents herein may be shown exaggerated in scale or in schematic formand some details of conventional elements may not be shown in theinterest of clarity and conciseness. When referring to the figuresdescribed herein, the same reference numerals may be referenced inmultiple figures for the sake of simplicity. In the followingdescription and in the claims, the terms “including” and “comprising”are used in an open-ended fashion, and thus, should be interpreted tomean “including, but not limited to.”

As used herein, a plurality of items, structural elements, compositionalelements, and/or materials may be presented in a common list forconvenience. However, these lists should be construed as though eachmember of the list is individually identified as a separate and uniquemember. Thus, no individual member of such list should be construed as ade facto equivalent of any other member of the same list solely based ontheir presentation in a common group without indications to thecontrary.

Concentrations, quantities, amounts, and other numerical data may bepresented herein in a range format. It is to be understood that suchrange format is used merely for convenience and brevity and should beinterpreted flexibly to include not only the numerical values explicitlyrecited as the limits of the range, but also to include all theindividual numerical values or sub-ranges encompassed within that rangeas if each numerical value and sub-range is explicitly recited. Forexample, a numerical range of 1 to 4.5 should be interpreted to includenot only the explicitly recited limits of 1 to 4.5, but also to includeindividual numerals such as 2, 3, 4, and sub-ranges such as 1 to 3, 2 to4, etc. The same principle applies to ranges reciting only one numericalvalue, such as “at most 4.5”, which should be interpreted to include allof the above-recited values and ranges. Further, such an interpretationshould apply regardless of the breadth of the range or thecharacteristic being described.

The term “electromagnetic radiation” or “EM radiation” shall meanelectromagnetic waves or photons that carry energy from a source. EMradiation is often categorized into spectral ranges by its interactionwith matter, for example radio waves, microwaves, infrared, visiblelight, ultraviolet light, x-rays, and gamma rays. As used herein, x-raysinclude wavelengths in the range of from 0.01 nanometers (nm) to 10 nm.Ultraviolet (UV) light, or the UV spectrum, includes light havingwavelengths of 190 nm to 400 nm. Visible light or the visible spectrumincludes light that is detectable by a human eye, for example from 400nm to 700 nm. In the UV and visible spectral ranges, chemical speciesmay absorb energy through electronic transitions in which an electron ispromoted from a lower orbital to a higher orbital. IR light, or the IRspectrum, includes light at wavelengths longer than the visible spectrumbut generally lower than the microwave region.

For example, the IR spectrum may include light having a wavelengthbetween 0.7 micrometers (microns) and 14 microns (700 nm to 14000 nm) inlength. At the longer wavelength end of this range, at 10 microns to 14microns (the far IR), chemical species may absorb energy throughrotational transitions. At an intermediate wavelength range of 2.5microns to 10 microns (the mid-IR), chemical species may absorb energythrough vibrational transitions. At the lower end of the wavelengthrange, at 0.7 microns to 2.5 microns (the near-IR), chemical species mayabsorb energy through vibrational transitions and through similarprocesses as visible and UV light, e.g., through electronic transitions.EM radiation detectors may form images from EM radiation in the visiblespectrum, IR spectrum, or UV spectrum.

The term “camera” as used herein means a device that can obtain a twodimensional image or a sequence of two dimensional images or frames(such as video or series of still images) in a particular EM radiationspectral range.

The term “chemical species” is any compound that may be released intothe environment as a gas, vapor, or liquid. Examples of chemical speciesthat may be detected using the systems and methods described hereininclude both hydrocarbons and other chemical species. Chemical speciesthat may be detected include but are not limited to hydrocarbon gas orvapors released in a cloud or plume into the air at an LNG plant orother facility or hydrocarbon liquids (e.g., oil) forming a slick on topof a body of water. Non-hydrocarbon species that may be detected includebut are not limited to hydrogen fluoride gas released in a refinery,chlorine gas released in a water treatment facility, or any number ofother liquids, gases, or vapors. A chemical species may also bedeliberately added to a process stream to enhance the detection of aplume using the systems and methods described herein.

The term “facility” as used herein means any location including atangible piece of physical equipment. For example, a tangible piece ofphysical equipment through which hydrocarbon fluids are produced from areservoir, injected into a reservoir, processed, or transported. Theterm facility includes any equipment that may be present along the flowpath between a reservoir and its delivery outlets. Facilities mayinclude production wells, injection wells, well tubulars, wellheadequipment, gathering lines, manifolds, pumps, compressors, separators,surface flow lines, steam generation plants, processing plants, anddelivery outlets. Examples of facilities include hydrocarbon productionfields, polymerization plants, refineries, LNG plants, LNG tankervessels, and regasification plants, among others.

The term “hydrocarbon” as used herein is an organic compound thatprimarily includes the elements hydrogen and carbon, although nitrogen,sulfur, oxygen, metals, or any number of other elements may be presentin small amounts. As used herein, hydrocarbons generally refer tocomponents found in natural gas, oil, or chemical processing facilities,such as refineries or chemical plants.

The term “natural gas” as used herein refers to a multi-component gasobtained from a crude oil well (associated gas) and/or from asubterranean gas-bearing formation (non-associated gas). The compositionand pressure of natural gas can vary significantly. A typical naturalgas stream contains methane (CH₄) as a major component, i.e., greaterthan 50 mol % of the natural gas stream is methane. The natural gasstream can also contain ethane (C₂H₆), higher molecular weighthydrocarbons (e.g., C₃-C₂₀ hydrocarbons), one or more acid gases (e.g.,hydrogen sulfide), or any combinations thereof. The natural gas can alsocontain minor amounts of contaminants such as water, nitrogen, ironsulfide, wax, crude oil, or any combinations thereof.

It has been found that, when using detection methods as described inWO2012/134796, there can be significant variations between the twodetectors. The present disclosure provides methods and detection systemsusing correlation coefficients to assist in the detection of a chemicalspecies. In particular, a plurality of correlation coefficients (e.g., afirst correlation coefficient, a second correlation coefficient, andoptionally a third correlation coefficient) for a region of interest areused to determine the correlation between a resultant image and imagesfrom a chemical band detector and a reference band detector. In thepresence of a chemical species, there is greater correlation between theresultant image and the chemical band image and less correlation betweenthe resultant image and reference band image as well as between thechemical band image and the reference band image in a region ofinterest. The use of correlation coefficients as described in thepresent disclosure improves the ability to detect a chemical speciesfrom images obtained from multiple detectors, reducing false positivesfrom background and noise interference. Embodiments of the presentdisclosure provide the ability of the detection system to be in motionwhile detecting a potential leak and provide the ability to detect apotential leak from images collected simultaneously through the use ofmultiple detectors, allowing for less complex algorithms to be used toanalyze for a potential leak. Use of less complex algorithms allows thecode to optionally be installed in firmware within components of thecollection system, reducing the analysis required by a separate computersystem.

Any suitable detection system which includes multiple EM radiationdetectors may be used. The multiple EM radiation detectors include afirst EM radiation detector configured to detect a chemical species(e.g., a chemical band EM radiation detector) and a second EM radiationdetector configured to provide a reference background (e.g., a referenceband EM radiation detector). FIG. 1 illustrates a detection system fordetecting a chemical species according to one or more embodiments of thepresent disclosure. Although one or more embodiments may describe theuse of the detection system to detect gaseous hydrocarbon releases suchas leaks, the present description is not so limited. The systems andmethods of the present disclosure may be used for detecting a chemicalspecies in any application.

Referring to FIG. 1, detection system 10 includes a collection system55. The collection system 55 including a lens 11 which receives IR rays21 from a scene to be detected having passed through a gaseous vaporrelease of a chemical species 25 originating from container 22. Thecollection system 55 also includes a beam splitter 12 which receives theinfrared rays 21 from the lens 11. The beam splitter 12 transmits afirst EM radiation beam 18 to a first bandpass filter 13 and reflects asecond EM radiation beam 19 to a second bandpass filter 14 reflected offmirror 17. Mirror 17 is optional; however, in the collection systemdepicted in FIG. 1, mirror 17 is provided so that first EM radiationdetector 15 and second EM radiation detector 16 may be arranged parallelto one another (side-by-side). In embodiments without the use of amirror, the second EM detector would be arranged ninety degrees (90°)from the first EM detector. Optionally, more than one mirror may be usedto direct an EM radiation beam within the detection system. The filteredfirst EM radiation beam 18′ is received by the chemical band EMradiation detector (the first EM radiation detector) 15 and the filteredsecond EM radiation beam 19′ is received by the reference band EMradiation detector (the second EM radiation detector) 16. The detectionsystem 10 may also include an analysis system 30. The analysis system 30may include a computer system 35. The computer system 35 includes adisplay 40, a processor 45, and a non-transitory, computer-readablemedium 50. The computer system 35 may be wired to one or more componentsof the collection system 55 or wirelessly connected to one or morecomponents of the collection system 55. Although shown in FIG. 1 asseparate analysis system 30 and computer system 35, in otherembodiments, firmware may be installed within a processor; anon-transitory, computer-readable medium; or a combination thereof,within the collection system. In this certain embodiment, the firmwaremay include the code for directing the processor to perform the analysisto detect a potential chemical species as well as other functions. Asdiscussed herein, the use of less complex algorithms allows the code tooptionally be installed in firmware within components of the collectionsystem, reducing the analysis required by a separate computer system.

The lens of the detection system may be any suitable lens. For example,the lens may be a fixed focal length lens or a multiple focal lengthlens (a zoom lens). The lens may be constructed of a material with hightransmittance in a desired wavelength range. In one or more embodiments,the lens may be constructed of a silicon material or a germaniummaterial for high transmittance in a mid-IR wavelength range.

The beam splitter may be any suitable beam splitter capable of receivingan EM radiation beam and splitting the EM radiation beam into aplurality of beams, for example at least two or more beams (first andsecond EM radiation beams or more), or at least three or more beams(first, second, and third EM radiation beams or more), or at least fouror more EM radiation beams (first, second, third, and fourth EMradiation beams or more), or at least five or more EM radiation beams(first, second, third, fourth, and fifth EM radiation beams or more). Inone or more embodiments, a beam splitter may be used to form two EMradiation beams which may be transmitted to an associated detector inthe IR spectrum, and a separate lens may be used to transmit another EMradiation beam to an associated detector in the visible spectrum toinfuse any detected chemical species into the visible image for easyhuman viewing.

In one or more embodiments, the beam splitter may be a broadbandsplitter or a prism.

In one or more embodiments, the beam splitter may be a broadband beamsplitter. The broadband splitter may be constructed from a commerciallyavailable material which has approximately a 50% transmittance rate anda 50% reflectance rate. In one or more other embodiments, the broadbandsplitter may have a higher transmittance rate to one of the detectors.For example, the broadband splitter may have a transmittance rate of 60%or 70% or 80% or more to one of the detectors, while the remainingdetectors receive 40% or 30% or 20% or less reflected from the broadbandsplitter. A broadband splitter transmits and reflects all wavelengthscontained in the EM radiation beam received by the broadband beamsplitter.

In one or more embodiments, the beam splitter may be a dichroic prism. Adichroic prism transmits the portion of the EM radiation beam withwavelengths below a cutoff wavelength value and reflects the portion ofthe EM radiation beam with wavelengths above the cutoff wavelengthvalue. The dichroic prism may have a high transmittance rate, forexample at least 80% or at least 90% or at least 95% or substantially100% of the wavelengths below the cutoff wavelength value. The dichroicprism may have a high reflectance rate, for example at least 80% or atleast 90% or at least 95% or substantially 100% of the wavelengths abovethe cutoff wavelength value.

In one or more embodiments, the cutoff value of the dichroic prism maybe between a lower limit of the transmittance window of a chemicalbandpass filter (e.g., the first bandpass filter) and the upper limit ofthe transmittance window of a reference bandpass filter (e.g., thesecond bandpass filter) when the transmittance window of the secondbandpass filter is offset (at lower wavelengths) from the transmittancewindow of the first bandpass filter. In one or more other embodiments,the cutoff wavelength value of the dichroic prism may be between theupper limit of the transmittance window of a chemical bandpass filter(e.g., the first bandpass filter) and the lower limit of thetransmittance window of a reference bandpass filter (e.g., the secondbandpass filter) when the transmittance window of the second bandpassfilter is offset (at greater wavelengths) from the transmittance windowof the first bandpass window. For example, the cutoff wavelength valueof the dichroic prism may be a value between the upper limit of thefirst transmittance window of the first bandpass filter and the lowerlimit of the second transmittance window of the second bandpass filter.As an exemplary embodiment, if the first transmittance window has awavelength range between 3.25 microns and 3.45 microns (a 200 nm width)and the second transmittance window has a wavelength range between 3.7microns and 4.1 microns (a 400 nm width), the cutoff wavelength valuemay be greater than 3.45 microns and less than 3.7 microns, such as 3.5microns, 3.55 microns, 3.6 microns, or 3.65 microns.

In one or more embodiments, the cutoff wavelength value may besubstantially halfway between the offset limits of the first and secondtransmittance windows. For example, the cutoff wavelength value may besubstantially halfway between the upper limit of the first transmittancewindow and the lower limit of the second transmittance window, or viceversa. In such an arrangement, the dichroic prism transmits the portionof the EM radiation beam having wavelengths less than the cutoffwavelength value and reflects the portion of the EM radiation beamhaving wavelengths greater than the cutoff wavelength value. In one ormore other embodiments, the cutoff wavelength value of the dichroicprism may be greater than the upper limit of the transmittance window ofthe first bandpass filter or less than the lower limit of the firstbandpass filter when the transmittance window for the second bandpassfilter overlaps the transmittance window of the first bandpass filter.The cutoff wavelength value of the dichroic prism may be a value asfurther discussed herein.

In one or more embodiments, a chemical bandpass filter (e.g., a firstbandpass filter) may be provided and may have a first transmittancewindow having a first width. The transmittance window of the firstbandpass filter transmits EM radiation within a first EM radiationwavelength range and substantially rejects all other wavelengths outsidethe first transmittance window. The first EM radiation wavelength rangeof the first transmittance window may correspond to at least a portionof a wavelength range of absorption or emission by at least one chemicalspecies to be detected. The transmittance window of the first bandpassfilter (e.g., a first transmittance window) has a width (e.g., a firstwidth) within an EM radiation wavelength range (e.g., a first EMradiation wavelength range). The transmittance window has a lower limitwavelength value and an upper limit wavelength value for the wavelengthrange. In one or more embodiments, the transmittance window for thefirst bandpass filter may have a width of at most 300 nm, at most 250nm, at most 225 nm, at most 200 nm, at most 150 nm, or at most 100 nm orless. The width of the transmittance window for the first bandpassfilter may be in the range of from 25 nm to 300 nm, from 50 nm to 250nm, or from 75 nm to 200 nm.

The wavelength range of the transmittance window for the first bandpassfilter may correspond to at least a portion of the wavelength range ofabsorption or emission by the at least one chemical species to bedetected. In one or more embodiments, the transmittance window for thefirst bandpass filter is within the EM radiation spectrum, for examplethe IR spectrum such as the mid-IR spectrum. In one or more embodiments,the transmittance window for the first bandpass filter may have a lowerlimit of at least 2.5 microns, for example at least 3 microns, at least3.25 microns, or at least 3.3 microns. In one or more embodiments, thetransmittance window for the first bandpass filter may have an upperlimit of at most 3.7 microns, for example at most 3.5 microns, at most3.45 microns, or at most 3.4 microns, for example in the range of from 3microns to 3.5 microns, from 3.25 microns to 3.45 microns, or from 3.3microns to 3.4 microns. In one or more embodiments, the chemical speciesmay be a hydrocarbon emitting or absorbing wavelengths within a range offrom 3.2 microns to 3.5 microns.

The transmittance window of a chemical bandpass filter (e.g., the firstbandpass filter) may transmit any suitable percentage of the first EMradiation beam within the wavelength range of the first transmittancewindow. In one or more embodiments, the transmittance window of thefirst bandpass filter may transmit at least 50% of the wavelengths ofthe first EM radiation beam received by the first bandpass filter withinthe wavelength range of the transmittance window. The transmittancewindow may transmit at least 75% or at least 80% or at least 90% or atleast 95% or substantially 100% of the first EM radiation beam withinthe wavelength range of the transmittance window.

In one or more embodiments, a reference bandpass filter (e.g., a secondbandpass filter) may be provided and may have a second transmittancewindow having a second width within an EM radiation wavelength range(e.g., a second EM radiation wavelength range). The second transmittancewindow passes or transmits EM radiation within a second EM radiationwavelength range and substantially rejects all other wavelengths outsidethe second transmittance window. The second transmittance window may beof any suitable width. In one or more embodiments, the secondtransmittance window may have an upper limit wavelength value that isgreater than an upper limit wavelength value of the first transmittancewindow. In one or more embodiments, the width of the secondtransmittance window may be at least 50 nm, for example at least 100 nm,at least 200 nm, at least 275 nm, at least 300 nm, at least 350 nm, atleast 400 nm, or at least 500 nm or more. For example, the width of thetransmittance window may be in the range of from 50 nm to 2000 nm, from275 nm to 1000 nm, or from 300 nm to 500 nm. In one or more embodiments,the transmittance window for the first bandpass filter may have a widthless than, greater than, or equal to the width of the secondtransmittance window for the second bandpass filter. For example, incertain embodiments, the width of the second transmittance window may beless than the width of the first transmittance window when the secondtransmittance window has an upper limit wavelength value that is greaterthan the upper limit wavelength value of the first transmittance window.This decrease in width may be used to reduce the energy level of thefiltered EM radiation beam having greater wavelengths (e.g., thefiltered second EM radiation beam or the filtered reference band EMradiation beam), also helping to match the energy levels of the filteredfirst EM radiation beam and the filtered second EM radiation beam. Forexample, in certain other embodiments, the width of the secondtransmittance window may be greater than the width of the firsttransmittance window. In this certain embodiment, a greater reduction inthe percentage of EM radiation transmitted by the reference bandpassfilter assists in matching the energy level of the filtered chemicalband EM radiation beam and the filtered reference band EM radiationbeam.

In one or more embodiments, the transmittance window of a referencebandpass filter (e.g., the second bandpass filter) may partially overlapat the upper limit or the lower limit of the first transmittance windowor may completely overlap the transmittance window of a chemicalbandpass filter (e.g., the first bandpass filter). For example, thelower limit of the second transmittance window (having an upper limitgreater than the upper limit of the first transmittance window) may beless than the upper limit or less than the lower limit of the firsttransmittance window. In another example, the upper limit of the secondtransmittance window (having a lower limit less than the lower limit ofthe first transmittance window) may be greater than the lower limit orgreater than the upper limit of the first transmittance window. In oneor more embodiments, the second transmittance window may have a lowerlimit of at least 2 microns, at least 3 microns, or at least 3.3 micronsor more and an upper limit of at most 5 microns, at most 4.5 microns, orat most 4 microns, for example in the range of from 3 microns to 5microns, from 3 microns to 4 microns, or from 3.3 microns to 4 microns.

In one or more other embodiments, the transmittance window of areference bandpass filter (e.g., the second bandpass filter) may beoffset from the transmittance window of a chemical bandpass filter(e.g., the first bandpass filter). The amount of offset may vary;however, the offset may be sufficient to enable the EM radiationdetectors to distinguish between the background of a scene and thechemical species to be detected within the scene. In other words, thetransmittance window of the second EM radiation detector has an offsetsuch that images from the second EM radiation detector includebackground EM radiation and are devoid of any emission or absorbancefrom chemical species to be detected. In one or more embodiments, thesecond transmittance window may be offset from the first transmittancewindow by at least 100 nm or at least 150 nm or at least 200 nm or more.For example, the lower limit wavelength value of the secondtransmittance window is greater than the upper limit wavelength value ofthe first transmittance window, e.g., the lower limit wavelength valueof the second transmittance window may be at least 100 nm or at least150 nm or at least 200 nm or more greater than the upper limitwavelength value of the first transmittance window. For example, thetransmittance window for the first bandpass filter may be within the IRspectrum, for example the mid-IR spectrum as discussed herein, and thetransmittance window for the second bandpass filter may have a lowerlimit of at least 3.5 microns or at least 3.7 microns and an upper limitof at most 4.5 microns or at most 4.25 microns or at most 4.1 microns orat most 4 microns, for example in the range of from 3.5 microns to 4.5microns or from 3.7 microns to 4.1 microns.

The widths and wavelength ranges for the first transmittance window andthe second transmittance window (e.g., partial overlap, completeoverlap, or offset) of a chemical bandpass filter and a referencebandpass filter may vary by application, equipment, and chemical speciesto be detected, but may at least be sufficient to enable the detectorsto distinguish between the background and the chemical species.

The transmittance window of a reference bandpass filter (e.g., thesecond bandpass filter) may transmit any suitable percentage of the EMradiation beam (e.g., the second EM radiation beam or the reference bandEM radiation beam) within the wavelength range of the transmittancewindow (e.g., the second transmittance window). In one or moreembodiments, the transmittance window of a reference bandpass filter(e.g., the second bandpass filter) may transmit a lesser percentage ofthe EM radiation beam (e.g., the second EM radiation beam) received bythe bandpass filter than a chemical bandpass filter (e.g., the firstbandpass filter) transmits of the EM radiation beam (e.g., the first EMradiation beam or the chemical band EM radiation beam) through itstransmittance window, as described in U.S. Provisional Application Ser.No. 62/015,924, filed Jun. 23, 2014, and titled, “System for Detecting aChemical Species and Use Thereof”, which is incorporated herein byreference in its entirety. The second transmittance window may transmitless than 50% of the wavelengths within the wavelength range of thetransmittance window, for example the second transmittance window maytransmit at most 45%, at most 40%, at most 35%, at most 30%, at most25%, or at most 20% of the second EM radiation beam within thewavelength range of the transmittance window. By decreasing thepercentage of the second EM radiation beam transmitted to the detectorby lowering the transmittance of the second bandpass filter, the energylevel of the filtered second EM radiation beam more closely matches theenergy level of the filtered first EM radiation beam, allowingsubstantially similar integration times and improving image qualitybetween the chemical band and reference band EM radiation detectors.

The first EM radiation detector may receive at least a portion of thefirst filtered EM radiation beam from the first bandpass filter todetect the filtered first EM radiation beam. The second EM radiationdetector may receive at least a portion of the filtered second EMradiation beam from the second bandpass filter to detect the filteredsecond EM radiation beam. In one or more other embodiments, the first EMradiation beam and the second EM radiation beam may be received by theassociated EM radiation detector from the beam splitter without anintervening bandpass filter. In one or more embodiments, the EMradiation beam may be received by the associated EM radiation detectorvia one or more mirrors which may be used to direct the beam. The EMradiation detectors (e.g., the first and second EM radiation detectors)may be conventional EM radiation detectors configured to detect EMradiation. The detectors include one or more sensors configured todetect EM radiation in the appropriate wavelength range. The one or moresensors are configured to include a plurality of pixels to detect theintensity of the EM radiation received by the detector. For example, thesensors may include a focal plane array, a charge-coupled device (CCD),a complementary metal-oxide-semiconductor (CMOS), and any combinationsthereof. In one or more embodiments, the one or more sensors of the EMradiation detectors may be included within a camera. In one or moreembodiments, the camera may include the components described hereinwithin the collection system. The collection system or camera may alsoinclude a readout integrated circuit (ROIC), video interface board, afield programmable gate array (FPGA), and any combinations thereof. Thecollection system or camera may also include a cooler such as acryogenic cooler, for example an integrated dewar cooler assembly(IDCA), configured to cool the sensors in the EM radiation detectors.The EM radiation detectors are configured to communicate with theanalysis system of the detection system. The communication componentsmay provide wired or wireless communication.

In one or more embodiments, the EM radiation detectors may be configuredto detect mid-IR EM radiation. The mid-IR EM radiation detector mayinclude one or more focal plane arrays which may include amercury-cadmium-telluride focal plane array, an indium-Antimonide focalplane array, an indium-gallium-arsenide focal plane array, a vanadiumoxide focal plane array, and any combinations thereof. The mid-IR EMradiation detectors may include at least one cooler configured to coolthe detector. Examples of gas-detecting IR cameras that are commerciallyavailable include GF320 and GF306 cameras manufactured by FLIR Systems,Inc., and EYE-C-GAS® camera manufactured by Opgal.

In one or more other embodiments, the multiple EM radiation detectorsmay include an EM radiation detector configured to detect visible ornear-IR EM radiation. The visible or near-IR EM radiation detector maybe a CCD, a CMOS, and any combinations thereof.

In one or more embodiments, the EM radiation beam forms an image on theassociated EM radiation detector. The EM radiation detector may beconfigured to generate a single image, a plurality of still images, or avideo of sequential images. Any number of EM radiation detectors may beused in a detection system, depending on the wavelength ranges to bedetected. Thus, the multiple EM radiation detectors may be the same ordifferent.

The detection system has an analysis system which may include aprocessor and non-transitory, computer-readable medium. The processor;the non-transitory, computer-readable medium; or combinations thereofmay comprise code. The analysis system may also include a display. Theanalysis system may also include a graphical processing unit (GPU). Thecode is configured to direct the processor to: identify at least a firstimage from one or more images from a chemical band EM radiation detector(e.g., the first EM radiation detector), the image including a firstplurality of pixels, each pixel having an associated intensity value;identify at least a second image from one or more images from areference band EM radiation detector (e.g., the second EM radiationdetector), the image including a second plurality of pixels, each pixelhaving an associated intensity value; generate at least one resultantimage, the first resultant image including a plurality of resultantpixels, each pixel having an associated intensity value; determine oneor more regions of interest based, at least in part, on the at least oneresultant image; generate a plurality of correlation coefficients for atleast one of the one or more regions of interest; and determine thepresence of at least one chemical species based, at least in part, onthe plurality of correlation coefficients. The plurality of correlationcoefficients includes a first correlation coefficient and a secondcorrelation coefficient and, optionally, a third correlationcoefficient. The first correlation coefficient is calculated by usingthe intensity values of a first subset of pixels from the firstplurality of pixels and a corresponding subset of resultant pixels fromthe plurality of resultant pixels within the corresponding region ofinterest. The second correlation coefficient is calculated by using theintensity values of a first subset of pixels from the second pluralityof pixels and the corresponding subset of resultant pixels from theplurality of resultant pixels within the corresponding region ofinterest. The third correlation coefficient may be calculated by usingthe intensity values of the first subset of pixels from the firstplurality of pixels and the first subset of pixels from the secondplurality of pixels within the corresponding region of interest.Additional correlation coefficients may be calculated for each of theadditional regions of interest of the first image, the second image, andthe first resultant image (e.g., a first correlation coefficient for anadditional region of interest based on a second subset of pixels fromthe first image and the corresponding resultant pixels from the firstresultant image; a second correlation coefficient for the additionalregion of interest based on a second subset of pixels from the secondimage and the corresponding resultant pixels from the first resultantimage; and a third correlation coefficient for the additional region ofinterest based on the second subset of pixels from the first image andthe second subset of pixels from the second image; etc.). The code ofthe analysis system may be further configured to direct the processor toperform various other functions described herein.

In one or more embodiments, an EM radiation detector of the detectionsystem may be mounted on a pole with at least two degrees of freedom,such as panning and tilting, under the manual control or the automaticcontrol of the system. Movement of an EM radiation detector may include360 degree coverage. Several EM radiation detectors may be positionedaround the perimeter of a plant to give 100% coverage of the facility.An autonomous system can provide continuous plant surveillance. Thesystem can continue monitoring the facility 24 hours a day, seven days aweek, and 365 days per year with minimal downtime. Downtime may mainlybe the result of performing routine maintenance on the system and may becompensated for by redundancy, e.g., directing one or more other EMradiation detectors at an area whose EM radiation detectors are beingserviced. The overall system cost may be kept low while keeping thefalse alarm rate low and still being able to detect small or earlyhydrocarbon leaks, e.g., plumes with about 20% LEL at a distance of 150meters subject to environmental conditions.

The detection system is not limited to pole-mounted EM radiationdetectors. In other embodiments, the EM radiation detectors may beattached to autonomous mobile platforms, placed on conveniently locatedtowers, or suspended from cables or balloons. The detection system mayalso be integrated into mobile robots, which are either autonomous orsteered by an operator.

In one or more embodiments, the detection system may be calibrated. Anysuitable calibration method may be used. In one or more embodiments, adifferential calibration method may be used, as described in U.S.Provisional Application Ser. No. 62/015,926, filed Jun. 23, 2014, andtitled, “Methods for Calibrating Multiple Detector System”, which isincorporated herein by reference in its entirety. In the differentialcalibration method, a multiple detector system may be calibrated bymatching individual pixels of an image from a chemical band EM radiationdetector (e.g., the first EM radiation detector) and individual pixelsof an image from a reference band EM radiation detector (e.g., thesecond EM radiation detector) to the average intensity of the pixels ofthe chemical band EM radiation detector. By matching the individualpixel intensity of the reference band EM radiation detector (e.g., thesecond EM radiation detector) to the average intensity of the chemicalband EM radiation detector (e.g., the first EM radiation detector), animproved image quality can be obtained when using the detection systemto determine the presence of a chemical species. This differentialcalibration method can decrease variability between the multipledetectors, increasing the ability to detect the presence of a chemicalspecies that might otherwise be masked by the intensity responsevariability between detectors. For example, the differences in intensitybetween the chemical band EM radiation detector and the reference bandEM radiation detector from independent calibration could be larger thanthe signal produced by the presence of a chemical species. Thisdifferential calibration method also improves image quality and helpsreduce false positives from background and noise interference.

Referring to FIG. 2, detection system 10 includes a lens 11 whichreceives IR rays 21 from a calibration EM radiation source 26. Thedetection system 10 also includes a beam splitter 12 which receives theinfrared rays 21 from the lens 11. The beam splitter 12 transmits afirst calibration EM radiation beam 28 to a first bandpass filter 13 andreflects a second calibration EM radiation beam 29 to a second bandpassfilter 14 reflected off mirror 17. The filtered first calibration EMradiation beam 28′ is received by the first EM radiation detector 15 andthe filtered second calibration EM radiation beam 29′ is received by thesecond EM radiation detector 16. Similar components of the detectionsystem of FIG. 2 use the same reference numbers as in FIG. 1. Theanalysis system of the detection system is not shown.

Referring to FIG. 3, differential method 300 for calibrating a multipledetector system is illustrated according to one or more embodiments ofthe present disclosure. At block 305, the calibration method beginsusing a detection system as described herein. At block 310, acalibration EM radiation beam is generated using a calibration EMradiation source. The calibration EM radiation source may be anysuitable source capable of providing a substantially uniform source ofEM radiation for calibrating an EM radiation detector. The calibrationEM radiation source is generated across the entire field of view of theEM radiation detectors. For example, the calibration EM radiation sourcemay be a blackbody. The calibration EM radiation beam is generated bythe source at a first temperature. The first temperature may be in therange of from minus 50° Celsius (C.) to 250° C. or from 0° C. to 175° C.or from 5° C. to 150° C. or from 20° C. to 100° C.

At block 315, at least a portion of the calibration EM radiation beam isdetected with the first EM radiation detector. The calibration EMradiation beam passes through the beam splitter to provide at least afirst calibration EM radiation beam and a second calibration EMradiation beam. At least a portion of the first calibration EM radiationbeam may pass through the first bandpass filter to generate a filteredfirst calibration EM radiation beam, at least a portion of which isdetected by the first EM radiation detector. At least a portion of thesecond calibration EM radiation beam may pass through the secondbandpass filter to generate a filtered second calibration EM radiationbeam, at least a portion of which is detected by the second EM radiationdetector.

At block 320, an average intensity (mean intensity) value of thecalibration EM radiation beam detected by the first EM radiationdetector is obtained. The average intensity value may be determined bycalculating the average intensity of a plurality of pixels containedwithin a calibration image from the first EM radiation detector.

At block 325, one or more of the plurality of pixels of the first EMradiation detector are adjusted to decrease the difference between theintensity of an individual pixel and the average intensity value of thefirst EM radiation detector. The intensity of an individual pixel in theROTC of the EM radiation detector may be adjusted by modifying the gain,offset, and combinations thereof to yield a substantially uniformresponse across the pixels of the EM radiation detector. In one or moreembodiments, after the calibration adjustment of the pixels of the firstEM radiation detector, the difference between an individual pixelintensity and the average pixel intensity of the first EM radiationdetector may be within at most five percent (5%) of the dynamic range ofthe sensor of the first EM radiation detector, for example within 1% orwithin 0.5% or within 0.1%.

At block 330, at least a portion of the calibration EM radiation beam isdetected with the second EM radiation detector. At block 335, one ormore of the plurality of pixels of the second EM radiation detector maybe adjusted to decrease the difference between the intensity of anindividual pixel and the average intensity value of the first EMradiation detector. Individual pixels may be adjusted in accordance withmethods discussed herein. In one or more embodiments, the integrationtime of the chemical band EM radiation detector may be selected tomaximize the sensitivity and adjust the dynamic range of the detector,and the integration time of the reference band EM radiation detector maybe selected such that its integration time may be different than thechemical band EM radiation detector to assist in matching the energylevel between the reference band EM radiation detector and the chemicalband EM radiation detector within a single clock cycle, assisting inmatching the resulting intensity levels between the chemical band EMradiation detector and the reference band EM radiation detector. In oneor more embodiments, after the calibration adjustment of the pixels ofthe second EM radiation detector, the difference between an individualpixel intensity and the average pixel intensity of the first EMradiation detector may be within at most 5% of the dynamic range of thesensor of the second EM radiation detector, for example within 1% orwithin 0.5% or within 0.1%. In one or more embodiments, the intensity ofa majority (more than 50%) of the plurality of pixels of the first EMradiation detector and a majority (more than 50%) of the plurality ofpixels of the second EM radiation detector are substantially the same asthe average intensity value for the first EM radiation detector aftercalibration adjustment.

If additional calibration is desired for additional temperatures, themethod reverts back to block 310 and generates a calibration EMradiation beam at one or more additional temperatures. This may berepeated for any number of desired calibration temperatures. Theadditional calibration temperatures may be within the ranges discussedherein for the first calibration temperature but have different values.If no additional calibration temperatures are desired, the differentialcalibration method may end at block 340. Additionally, if more than twodetectors are used in the detection system, the method may also includeadditional steps to calibrate the additional detectors, for exampleadditional detectors similar to the first EM radiation detector may becalibrated by adjusting one or more pixels of the additional EMradiation detector to decrease the difference between the intensity ofan individual pixel and the average intensity value of the first EMradiation detector, and additional detectors which are not similar tothe first EM radiation detector, such as a visible EM radiationdetector, may be calibrated using any appropriate calibration method forsuch detector.

In one or more embodiments, the code of the analysis system mayadditionally be configured to direct the processor to: obtain an averageintensity value of a plurality of pixels from a chemical band EMradiation detector (e.g., the first EM radiation detector) detecting thecalibration EM radiation beam; adjust one or more pixels of an imagefrom the first EM radiation detector to decrease the difference betweenthe intensity of an individual pixel and the average intensity value ofthe first EM radiation detector; and adjust one or more pixels of areference band EM radiation detector (e.g., the second EM radiationdetector) detecting the calibration EM radiation beam to decrease thedifference between the intensity of an individual pixel and the averageintensity value of the first EM radiation detector.

In one or more embodiments, an image quality enhancement method may beapplied to images from a chemical band EM radiation detector and areference band EM radiation detector. Any suitable enhancement methodmay be used. In one or more embodiments, a differential image qualityenhancement method may be applied to images from a chemical band EMradiation detector and a reference band EM radiation detector, asdescribed in U.S. Provisional Application Ser. No. 62/015,921, filedJun. 23, 2014, and titled, “Methods for Differential Image QualityEnhancement for a Multiple Detector System, Systems and Use Thereof”,which is incorporated herein by reference in its entirety. Thedifferential image quality enhancement analyzes the pixels from an imagefrom the chemical band EM radiation detector to determine the gainand/or offset to be applied to images. The determined gain and/or offsetis applied to the images from the chemical band EM radiation detectorand also to the images of the reference band EM radiation detector.Adjusting the images from the reference band EM radiation detector usingthe gain and/or offset determined for the images from the chemical bandEM radiation detector reduces the variability in intensity valuesbetween the detectors, increasing the ability to detect the presence ofa chemical species that would otherwise be masked by the intensityresponse variability between detectors.

In such differential image quality enhancement, the analysis system mayhave code further configured to direct the processor to: identify animage from one or more images from a chemical band EM radiation detector(e.g., the first EM radiation detector), the image including a pluralityof pixels, each pixel having an associated intensity value; identify animage from one or more images from a reference band EM radiationdetector (e.g., the second EM radiation detector), the image including aplurality of pixels, each pixel having an associated intensity value;adjust one or more intensity values of the plurality of pixels of theimage from the second EM radiation detector based on one or moreintensity value parameters of the image from the first EM radiationdetector; and adjust one or more intensity values of the plurality ofpixels of the image from the first EM radiation detector based on one ormore intensity value parameters of the image from the first EM radiationdetector. The differential image quality enhancement may be applied tothe images automatically or through manual operator input. Theadjustment values may be continually updated or periodically updatedafter a set number of images have been generated, for example no morethan 50 successive images have been generated, or no more than 25successive images have been generated, or no more than 15 successiveimages have been generated. With periodic updating, the determinedadjustment values for the pixels may be applied to the pixels ofsubsequent images to enhance the image quality of those images until theadjustment values are updated.

The method for differential image quality enhancement may includeobtaining an image from one or more images from a chemical band EMradiation detector (e.g., the first EM radiation detector). The chemicalband image includes a plurality of pixels, each pixel having anassociated intensity value. An image from one or more images from areference band EM radiation detector (e.g., the second EM radiationdetector) may be obtained. The reference band image includes a pluralityof pixels, each pixel having an associated intensity value. One or moreintensity values of the plurality of pixels of the image from the secondEM radiation detector may be adjusted based on one or more intensityvalue parameters of the image from the first EM radiation detector. Theadjusting of the one or more intensity values of the plurality of pixelsmay include adjusting the gain, offset, and combinations thereof basedon one or more intensity value parameters of the image from the first EMradiation detector. The intensity value parameters may include a maximumintensity value for the plurality of pixels (I_(max)), a minimumintensity value for the plurality of pixels (I_(min)), and combinationsthereof.

In one or more embodiments, the maximum intensity value, the minimumintensity value, and combinations thereof may be determined based on asubset of the plurality of pixels from an image from a chemical band EMradiation detector corresponding to an area of interest. A plurality ofareas of interest may be identified in images relevant for applying thedifferential image quality enhancement. A maximum intensity value, aminimum intensity value, and combinations thereof may be determined foreach of the areas of interest based on corresponding subsets of theplurality of pixels from an image from a chemical band EM radiationdetector. Corresponding subsets of the plurality of pixels from an imagefrom a reference band EM radiation detector may be adjusted based on themaximum intensity values, minimum intensity values, and combinationsthereof for each of the areas of interest of the image from the chemicalband EM radiation detector.

An EM detector may have an input frame having a given range of inputframe intensities and an output frame having a given range of outputframe intensities. The range of intensities for the output frame may beless than the range for the input frame, requiring an adjustment of theimage. Adjustment of the gain and/or offset of the pixels of an image,whether from a chemical band EM radiation detector or a reference bandEM radiation detector, may be based on the intensity values of thepixels of the chemical band image (e.g., the first plurality of pixels).The plurality of pixels in the images from the chemical band EMradiation detector and the plurality of pixels in the images from thereference band EM radiation detector may substantially correspondtemporally, spatially, or both. The gain and offset may be adjusted forindividual pixels from the multiple detectors based on the intensityvalues of the plurality of pixels of the chemical band image. Pixelsfrom subsequent images from the chemical band EM radiation detector andthe reference band EM radiation detector (e.g., the first EM radiationdetector and the second EM radiation detector) may also be adjustedbased on the values for gain and/or offset determined from thedifferential image quality enhancement analysis of one or more priorimages. In one or more embodiments, the differential image qualityenhancement method may be applied periodically to update values for gainand/or offset to be applied to the pixels of the images. The frequencyof which the method may be applied may be after a set number of imageshave been generated, for example the periodic adjustment occurs after nomore than 50 successive images have been generated, or no more than 25successive images have been generated, or no more than 15 successiveimages have been generated.

The adjustment of the gain of a pixel depends on the dynamic range ofthe input frame and the dynamic range of the output frame. The maximumintensity measured by the input frame and the minimum intensity measuredby the input frame are determined, and then a differential dynamic rangerepresenting the difference between the maximum intensity and theminimum intensity is determined. The intensities of the pixels in theoutput frame are adjusted based on the differential dynamic range ofintensities determined from the input frame. For example, the inputframe of the first and second EM radiation detectors may be a videoframe having a 14-bit depth (2¹⁴ for a 0 to 16384 dynamic intensityrange) and an output frame of an 8-bit depth (2⁸ for a 0 to 256 dynamicintensity range). If the first plurality of pixels of the image from thefirst EM radiation detector has a maximum intensity of 7100 and aminimum intensity of 4000 in the input frame, the differential dynamicrange is 3100. The output frame has a dynamic intensity range of 0 to256, so the differential dynamic range of 3100 may be scaled to the 256dynamic range of the output frame (gain control). This technique mayalso be applied separately for a plurality of areas of interest withinthe chemical band image using the intensity values within a subset ofpixels for each area of interest. The differential gain control may beachieved using any suitable method, for example the gain to be appliedto the pixel intensities in the output frame for a 256 dynamic intensityrange may be determined by the following:

Gain=256/(I_(max)−I_(min)), where I_(max) is the maximum intensity pixelfrom the first plurality of pixels of the first EM radiation detectorand I_(min) is the minimum intensity pixel from the first plurality ofpixels of the first EM radiation detector.

The offset may be adjusted by adding or subtracting a quantity to theintensity of a pixel. Offset may be determined using any suitablemethod, for example the offset may be determined with respect to theexample discussed above by the following:

Offset=I _(min)*(256/(I _(max) −I _(min))).

The intensity of the pixel in the output frame may be determined by thefollowing: I_(out)=(I*Gain)−Offset, where I is the intensity of thepixel in the input frame and I_(out) is the intensity of the pixel inthe output frame. Therefore, in the example, for a pixel of the secondplurality of pixels from the second EM radiation detector which has anintensity in the output frame of 6435, the gain would be 0.08 and theoffset would be 330 so that the intensity in the output frame (I_(out))would be 185. In this example, the other pixels of the second pluralityand first plurality are likewise adjusted to achieve correspondingoutput frame intensity levels.

In one or more other embodiments, a histogram of the intensity values ofthe pixels may be generated. FIGS. 4A and 4B illustrate histograms of afirst plurality of pixels 405 of an image from a chemical band EMradiation detector (e.g., a first EM radiation detector) configured todetect wavelengths in the range for the emission or absorption of achemical species and a second plurality of pixels 410 of an image from areference band EM radiation detector (e.g., a second EM radiationdetector) configured to detect wavelengths outside of the range ofwavelengths of the emission or absorption of a chemical species. Asshown in FIG. 4A, substantially all of the first plurality of pixelshave intensities within two peaks 415, 420. The intensity is representedalong the x-axis and the number of pixels having the same intensityvalue is represented along the y-axis. The second plurality of pixelsfrom the second EM radiation detector similarly has substantially all ofthe pixels having intensities within two peaks 425, 430; however, peaks425, 430 are shifted to the right of peaks 415, 420. An offset may beapplied to either the first plurality of pixels or the second pluralityof pixels to adjust the intensity values of the plurality of pixels suchthat the intensity value distribution of the first plurality of pixelssubstantially aligns with the intensity value distribution of the secondplurality of pixels (histogram matching method). As shown in FIG. 4B,peaks 415, 425 and 420, 430 are substantially aligned after applying theoffset. The intensity values of the second plurality of pixels and firstplurality of pixels may also be adjusted by adjusting the gain. The gainmay be determined as discussed herein.

In one or more embodiments, one or more subsets of the first pluralityof pixels having similar intensities may be identified as one or moreareas of interest (e.g., a first area of interest, a second area ofinterest, etc.) within the histogram. The corresponding pixels of thesecond plurality of pixels are also identified. The one or more areas ofinterest may each consist of one or more pixels having intensity valueswithin a defined range of intensity values. For example, referring toFIGS. 4A and 4B, a first area of interest may include both peaks 415,420 for the first plurality of pixels and peaks 425, 430 for the secondplurality of pixels or a first area of interest may include peak 415 forthe first plurality of pixels and peak 425 for the second plurality ofpixels, and a second area of interest may include peak 420 for the firstplurality of pixels and peak 430 for the second plurality of pixels.

In one or more other embodiments, the images from the first EM radiationdetector and the second EM radiation detector may be separated into aplurality of areas of interest. The plurality of areas of interest mayinclude a majority (more than 50%) of the area of the images.

In one or more other embodiments, the pixels within one or more areas ofinterest (e.g., a first area of interest, a second area of interest,etc.) may be determined by identifying at least one of the firstplurality of pixels along with one or more adjacent pixels to form asubset of pixels defining an area of interest. The corresponding pixelsof the second plurality of pixels may be identified for each subset anda histogram of the intensity values of the pixels within each of theareas of interest may be generated. The pixels of the first plurality ofpixels and the second plurality of pixels within the one or more areasof interest may be substantially aligned temporally, spatially, or both.An offset may be applied based on the intensity values within each ofthe one or more areas of interest to substantially align the intensitydistributions. The gain may also be determined based on the intensityvalues within each of the one or more areas of interest. The one or moreareas of interest may be of any suitable size, for example at least a10×10 grid of adjacent pixels, at least a 20×20 grid, etc.

Identifying the pixels for a subset may be determined by the differencesbetween the intensity values of the first plurality of pixels and thecorresponding second plurality of pixels and applying an imageenhancement threshold value to the determined differences in intensityvalues. One or more pixels satisfying the image enhancement thresholdvalue may be included in a subset for one of the one or more areas ofinterest. The image enhancement threshold value may be similar to theresultant threshold values described herein.

In one or more embodiments, the differences between intensity valuesbetween the plurality of pixels (e.g., n₁ to n_(z)) of an image from achemical band EM radiation detector (e.g., the first EM radiationdetector) and the corresponding plurality of pixels (e.g., m₁ to m_(z))of an image from a reference band EM radiation detector (e.g., thesecond EM radiation detector) may be determined by calculating the ratioof the intensity values between the corresponding pixels of the images.For example, the differences between intensity values between the firstplurality of pixels (e.g., n₁ to n_(z)) of the first image and thecorresponding second plurality of pixels from the second image may bedetermined by calculating the ratio of the intensity values between eachof the first plurality of pixels of the first image and thecorresponding second plurality of pixels of the second image.

In one or more other embodiments, the differences between intensityvalues between the plurality of pixels (e.g., n₁ to n_(z)) of an imagefrom a chemical band EM radiation detector (e.g., the first EM radiationdetector) and the corresponding plurality of pixels (e.g., m₁ to m_(z))of an image from a reference band EM radiation detector (e.g., thesecond EM radiation detector) may be determined by subtracting theintensity values between the corresponding pixels of the images. Forexample, the differences between intensity values of the first pluralityof pixels and the corresponding second plurality of pixels is determinedby subtracting the intensity values between each of the first pluralityof pixels (e.g., n₁ to n_(z)) of the first image and the correspondingsecond plurality of pixels of the second image. The difference inintensity values may be represented by both the sign and the magnitudeor may be absolute values.

An offset may be applied to either the first plurality of pixels or thesecond plurality of pixels within each of the one or more areas ofinterest to adjust the intensity values of the plurality of pixels suchthat the intensity value distribution of the first plurality of pixelssubstantially aligns with the intensity value distribution of the secondplurality of pixels within the area of interest. The intensity values ofthe second plurality of pixels and first plurality of pixels may also beadjusted by adjusting the gain based on the intensity value parametersof the pixels of the chemical band image. The gain may be determinedbased on the intensity value parameters of the first plurality of pixelsas a whole or the intensity value parameters of the subset of the firstplurality of pixels within each of the areas of interest. The subsets ofpixels of the first plurality of pixels and the second plurality ofpixels within the one or more areas of interest may be substantiallyaligned temporally, spatially, or both.

In one or more other embodiments, differential non-uniformity correction(DNUC) methods may be used in the systems and methods for differentialimage quality enhancement. As discussed further herein, the DNUC methodsuse pixel values from images from multiple detectors to identify one ormore areas of interest to determine the gain and offset adjustments forthe images as well as subsequent images. Such method may includeidentifying one or more areas of interest for differential image qualityenhancement by providing a calibration EM radiation source and obtaininga baseline image (e.g., a first baseline image) from a chemical band EMradiation detector (e.g., the first EM radiation detector), the detectordetecting at least a portion of the calibration EM radiation source at afirst temperature. The first baseline image includes a plurality ofpixels, each pixel having an associated intensity value. A baselineimage (e.g., a second baseline image) may be obtained from a referenceband EM radiation detector (e.g., the second EM radiation detector), thedetector detecting at least a portion of the calibration EM radiationsource at a first temperature. The second baseline image includes aplurality of pixels, each pixel having an associated intensity value.Baseline information of the difference in intensity values between eachof the plurality of pixels of the first baseline image and the pluralityof pixels of the second baseline image may be determined. The pluralityof pixels of the first baseline image and the plurality of pixels of thesecond baseline image may be substantially aligned temporally,spatially, and combinations thereof A table of the baseline informationmay be generated (e.g., a first table). The table includes thedifferences in intensity values between the plurality of pixels of thefirst baseline image and the plurality of pixels of the second baselineimage. Upon further generating images of a scene in which a chemicalspecies may be detected, the difference in intensity values between thefirst plurality of pixels of the image of the scene (e.g., the firstimage) from a chemical band EM radiation detector (e.g., the first EMradiation detector) and the second plurality of pixels of the image ofthe scene (e.g., the second image) from a reference band EM radiationdetector (e.g., the second EM radiation detector) may be determined(e.g., a resultant image). The first plurality of pixels and the secondplurality of pixels may be substantially aligned temporally, spatially,and combinations thereof. The baseline information of the table may thenbe applied to the difference in intensity values between the firstplurality of pixels and the corresponding second plurality of pixels ofthe images of the scene to be detected. Pixels proximate one anotherrepresenting non-zero values after application of the table values maybe grouped to form the one or more areas of interest. The intensityvalues of the first plurality of pixels and the second plurality ofpixels may also be adjusted according to the embodiments discussedherein with respect to gain and/or offset within each of the one or moreareas of interest based on one or more intensity value parameters of thefirst image of the scene.

In one or more other embodiments, the DNUC method may be based on atable from images of a scene for detection instead of images from acalibration EM radiation source. In this embodiment, an image (e.g., afirst baseline image) may be obtained from a chemical band EM radiationdetector (e.g., the first EM radiation detector) of the scene fordetection (in the absence of a chemical species to be detected) and animage (e.g., a second baseline image) may be obtained from a referenceband EM radiation detector (e.g., the second EM radiation detector) ofthe scene for detection. Baseline information of the difference inintensity values between each of the first plurality of pixels of thefirst baseline image from the first EM radiation detector and the secondplurality of pixels of the second baseline image from the second EMradiation detector may be obtained. The first plurality of pixels andthe second plurality of pixels may be substantially aligned temporally,spatially, and combinations thereof A table (e.g., a first table) of thebaseline information may be generated. The table includes thedifferences in intensity values between the first plurality of pixelsand the second plurality of pixels. Subsequent additional images fromthe first and second EM radiation detectors may be generated. Theadditional images from the first EM radiation detector (e.g., a firstimage, a third image, a fifth image, etc.) and additional images fromthe second EM radiation detector (e.g., a second image, a fourth image,a sixth image, etc.) may be obtained. The difference in intensity valuesbetween corresponding images from the first EM radiation detector andthe second EM radiation detector may be determined, and the baselineinformation of the table may then be applied to the difference inintensity values of the plurality of pixels. Pixels proximate oneanother representing non-zero values after application of the tablevalues may be identified and may be grouped to form the one or moreareas of interest. The intensity values of the plurality of pixels fromimages from the chemical band EM radiation detector and images from thereference band EM radiation detector may also be adjusted according tothe embodiments discussed herein with respect to gain and/or offsetwithin each of the one or more areas of interest based on one or moreintensity value parameters of the image from the chemical band EMradiation detector.

For example, a first baseline image from the first EM radiation detectorand a second baseline image from the second EM radiation detector of ascene for detection may be used to generate a first table of baselineinformation. A first image from the first EM radiation detector of ascene for detection of a chemical species and a second image from thesecond EM radiation detector may be obtained. The first image includes afirst plurality of pixels and the second image includes a secondplurality of pixels. Each of the first plurality of pixels and thesecond plurality of pixels are temporally and spatially aligned. Thebaseline information in the first table is applied to the difference inintensity values between each of the temporally and spatially alignedfirst plurality of pixels and second plurality of pixels. The pixelsproximate one another representing non-zero values are identified andmay be grouped into a subset to form one of the one or more areas ofinterest. Within each of the identified one or more areas of interest,the intensity values of the subset of the first plurality of pixels ofthe first detection image and the second plurality of pixels of thesecond detection image are adjusted based on one or more intensity valueparameters of the first detection image for each of the one or moreareas of interest, according to embodiments discussed herein. A thirddetection image from the first EM radiation detector and a fourthdetection image from the second EM radiation detector may be obtained.The third detection image includes a third plurality of pixels and thefourth detection image includes a fourth plurality of pixels. Each ofthe third plurality of pixels and the fourth plurality of pixels aretemporally and spatially aligned. The baseline information in the firsttable is applied to the difference in intensity values between each ofthe temporally and spatially aligned third plurality of pixels andfourth plurality of pixels. The pixels proximate one anotherrepresenting non-zero values are identified and may be grouped into asubset to form one of the one or more areas of interest. Within each ofthe identified one or more areas of interest, the intensity values ofthe third plurality of pixels of the third detection image and thefourth plurality of pixels of the fourth detection image are adjustedbased on one or more intensity value parameters of the third detectionimage for each of the one or more areas of interest, according toembodiments discussed herein.

In one or more other embodiments, differential high sensitivity mode(DHSM) methods may be used in the systems and methods for differentialimage quality enhancement. As discussed further herein, the DHSM methodsuse pixel intensity values from images from multiple detectors toidentify one or more areas of interest to determine the gain and/oroffset adjustments for the images as well as subsequent images. In oneor more embodiments, the DHSM method determines a moving average of thedifferences in intensity values of the corresponding pixels and uses themoving average as the baseline information in the table. The baselineinformation is applied to the differences in intensity values ofsubsequent images from the chemical band EM radiation detector (e.g.,the first EM radiation detector) and the reference band EM radiationdetector (e.g., the second EM radiation detector). Pixels proximate oneanother representing non-zero values after application of the tablevalues may be identified and may be grouped to form the one or moreareas of interest. Within each of the identified one or more areas ofinterest, the intensity values of the plurality of pixels of asubsequent image from the first EM radiation detector and the second EMradiation detector may be adjusted based on one or more intensity valueparameters of the corresponding subsequent image from the first EMradiation detector, according to the embodiments discussed herein. Afterthe identification of the one or more areas of interest, the table maybe updated to include the subsequent images in the moving average of thebaseline information.

For example, a first, third, and fifth image may be obtained from thefirst EM radiation detector and a second, fourth, and sixth image may beobtained from the second EM radiation detector. The first and secondimages are substantially aligned temporally and spatially. The third andfourth images are substantially aligned temporally and spatially. Thefifth and sixth images are substantially aligned temporally andspatially. The first, second, third, and fourth images are used asbaseline images for determining the moving averages for the baselineinformation. The moving average is determined based on the differencesin intensity values of the first plurality of pixels of the first imageand the second plurality of pixels of the second image and the thirdplurality of pixels of the third image and the fourth plurality ofpixels of the fourth image. The fifth and sixth images are used asdetection images for determining the presence of a chemical species. Thedifference in intensity values between the fifth plurality of pixels ofthe fifth image and the sixth plurality of pixels of the sixth image isdetermined and the baseline information is applied. Pixels proximate oneanother representing non-zero values after application of the tablevalues are identified and may be grouped into a subset to form one ofthe one or more areas of interest. Within each of the identified one ormore areas of interest, the intensity values of the plurality of pixelsof the subsequent image (e.g., fifth image) from the first EM radiationdetector and the subsequent image (e.g., sixth image) from the second EMradiation detector may be adjusted based on one or more intensity valueparameters of the corresponding subsequent image (e.g., fifth image)from the first EM radiation detector, according to the embodimentsdiscussed herein. After identification of the one or more areas ofinterest, the moving averages of the baseline information are updated toinclude the difference in intensity values of the fifth and sixthimages, etc. This may continue for any number of subsequent images fromthe first and second EM radiation detectors. In one or more embodiments,the moving averages for the baseline information of the differences inintensity values may be determined based on at least 10 sets of previousimages from the first and second EM radiation detectors or at least 25sets of images or at least 100 sets of images.

In one or more embodiments of the DNUC and DHSM methods, a baselinethreshold value may be applied to the pixels representing non-zerovalues after applying the baseline information from the table to thedifference in intensity values of the pixels of the images. Applying abaseline threshold value may eliminate pixels being identified for theone or more areas of interest due to noise and interference variations.

FIG. 5 illustrates a flow chart for a method of differential imagequality enhancement for a detection system including multiple EMradiation detectors in accordance with one or more embodiments of thepresent disclosure. The differential image quality enhancement method500 begins at block 505. At block 510, an image is obtained from achemical band EM radiation detector (e.g., the first EM radiationdetector). At block 515, an image is obtained from a reference band EMradiation detector (e.g., the second EM radiation detector). At block520, one or more intensity values of a plurality of pixels of the imagefrom the reference band EM radiation detector are adjusted (gain and/oroffset) based on one or more intensity value parameters from the imagefrom the chemical band EM radiation detector, according to one or moreembodiments described herein. At block 525, one or more intensity valuesof a plurality of pixels of the image from the chemical band EMradiation detector are adjusted (gain and/or offset) based on the one ormore intensity value parameters from the chemical band image, accordingto one or more embodiments described herein. At block 530, theadjustment values applied at block 520, 525 may be applied to subsequentimages from the chemical band and reference band EM radiation detectors(e.g., the first and second EM radiation detectors). The adjustmentvalues from block 520, 525 may be periodically updated by returning toblock 510 of the differential image quality enhancement process. If nofurther adjustments are desired, the enhancement process ends at block535.

The detection system may be used in any facility that has hydrocarbons,or other detectable chemical species, present. Examples of suchfacilities include LNG plants, oil and gas wellhead operations, offshoreplatforms, transport pipelines, ships, trucks, refineries, and chemicalplants, as described herein. As noted, the chemical plume may be agaseous hydrocarbon or an oil slick on a surface of water, such asaround an offshore platform, tanker, off-loading platform, and the like.

If a positive identification of a leak is made, the detection system maylocate the leak and activate an alarm, alerting an operator to send aresponse team to the site of the leak. The response team may confirm thepresence of the leak and effectuate repairs. In one or more embodiments,the hydrocarbon leak may be shown as a false color image for easieroperator interpretation. Further, the system may have zoom capability toassist the operator when doing a leak investigation in a manual mode. Inone or more embodiments, the EM radiation detectors may be able to beoperated in both the automatic and manual modes. Thus, in the event ofan alarm, an operator may be able to take control of the EM radiationdetectors to do further investigation.

In one or more embodiments, the system may be configured to work over abroad temperature range, including warm and cold temperatures such as ahot, tropical, or desert environment or a cold, arctic environment.Further, the detection system may be adapted to function in the day ornight and at a variety of temperatures, for example ranging from minus50° C. to 100° C. The detection system may also be configured to operateunder other environmental interferences such as in fog, rain, orsandstorms. In one or more embodiments, the detection system may detecthydrocarbons such as methane, ethane, propane, butane, pentane, hexane,heptane, octane, ethylene, propylene, isoprene, benzene, ethyl benzene,toluene, xylene, and methyl ethyl ketone, among others. The detectionsystem may be additionally or alternatively configured to detect otherchemical species which are capable of being imaged.

The present detection systems may utilize ambient EM radiation energyfor the detection, but may also utilize artificial illumination sourcesfor the EM radiation to detect a chemical species. In one or moreembodiments, an EM radiation source, e.g., a light source, may be usedto illuminate the environment. For example, an IR laser may be used toilluminate an area of interest for leak confirmation. The light sourcemay be useful in conditions in which the contrast between a plume andthe background may not be sufficient to distinguish the chemicalspecies. The light source may be powered, activated, or moved using alight source control in communication with the present system.

The detection system is not limited to the detection of chemical plumes,but may also provide other functionality. For example, in one or moreembodiments, the detection system may be used to detect an event otherthan the release of a chemical species such as to monitor specificequipment, such as furnaces, reactors, compressors, and the like,looking for such problems as hot spots, maldistribution, hot motors, andthe like. Further, the detection system may provide fence-linemonitoring for security purposes and monitoring of fugitive emissionsinto the environment from equipment.

In one or more embodiments, the detection system may include a masterclock. The EM radiation detectors may be configured to receive a signalfrom the master clock to synchronize the frame rate and/or integrationtime of the EM radiation detectors. The synchronization may beaccomplished through the clocking circuit in the ROTC of the EMradiation detectors. Such synchronization may improve the temporalalignment of the images. In one or more embodiments, one of the EMradiation detectors may be designated as the master and generates aclock signal to the other EM radiation detectors, which are designatedas a slave to the master EM radiation detector and receive the clocksignal. The resulting frame rate of each EM radiation detector is thensynchronized to the shared clock signal.

In one or more embodiments, images from the chemical band EM radiationdetector and the reference band EM radiation detector may be spatiallyaligned. Images may be spatially aligned using any suitable method. Inone or more embodiments, spatial alignment may be accomplished bykeeping the EM radiation detectors stationary. In one or more otherembodiments, the images may be registered such that a software programmay provide spatial alignment using a software registration method whichuses features in the image for alignment. In one or more embodiments,the EM radiation detectors may be configured to be substantiallyspatially aligned. In one or more embodiments, the EM radiationdetectors may be both substantially temporally and spatially aligned.The images may be registered such that the images may be substantiallymatched in spatial alignment pixel by pixel, temporal alignment, or thecombination thereof.

In one or more embodiments, the integration times of the EM radiationdetectors may be substantially the same or different. In one or moreembodiments, the integration time of a chemical band EM radiationdetector (e.g., the first EM radiation detector) may be substantiallythe same as the integration time of a reference band EM radiationdetector (e.g., the second EM radiation detector) and the transmittanceof a reference bandpass filter (e.g., the second bandpass filter) may beless than a chemical bandpass filter (e.g., the first bandpass filter)as described herein. By decreasing the transmittance of a referencebandpass filter, the energy level of the resulting filtered EM radiationbeam can more closely match the energy level of a filtered chemical bandEM radiation beam, assisting in matching the resulting intensity levelsbetween the chemical band EM radiation detector and the reference bandEM radiation detector.

In one or more other embodiments, the integration time of a referenceband EM radiation detector (e.g., the second EM radiation detector) maybe different than the chemical band EM radiation detector (e.g., thefirst EM radiation detector) to assist in matching the energy levelbetween the reference band EM radiation detector and the chemical bandEM radiation detector within a single clock cycle, assisting in matchingthe resulting intensity levels between the chemical band EM radiationdetector and the reference band EM radiation detector. For example, theintegration time of a reference band EM radiation detector (e.g., thesecond EM radiation detector) may be less than the integration time of achemical band EM radiation detector (e.g., the first EM radiationdetector). In one or more embodiments, the integration time of thesecond EM radiation detector may be at most 95% of the integration timeof the first EM radiation detector, for example at most 75%, at most50%, at most 40%, or at most 33% of the integration time of the first EMradiation detector. When the energy level of the reference band EMradiation beam is greater than the chemical band EM radiation beam,decreasing the integration time of a reference band EM radiationdetector (e.g., the second EM radiation detector) can more closely matchthe energy levels of the EM radiation beams, assisting in matching theresulting intensity levels between the chemical band EM radiationdetector and the reference band EM radiation detector. Conversely, whenthe energy level of the chemical band EM radiation beam is greater thanthe reference band EM radiation beam, decreasing the integration time ofa chemical band EM radiation detector (e.g., the first EM radiationdetector) can more closely match the energy levels of the EM radiationbeams. However, significant differences in integration times can resultin image blurring due to the time differences, reducing image quality.

In one or more embodiments, a preliminary threshold criteria may beapplied to the pixels from images from a chemical band EM radiationdetector and images from a reference band EM radiation detector toremove pixels satisfying the preliminary threshold criteria from furtherconsideration. The preliminary threshold criteria may include at least afirst preliminary threshold value and a second preliminary thresholdvalue. Pixels having intensity values greater than the first preliminarythreshold value may be removed from further consideration. Pixels havingintensity values less than the second preliminary threshold value may beremoved from further consideration.

In one or more embodiments, determining the presence of at least onechemical species includes generating a resultant image. The resultantimage may be based, at least in part, on the data generated by the firstand second EM radiation detectors, for example a single image, a seriesof still images, or video images generated by the detectors. Thepresence or absence of a chemical species is determined based, at leastin part, on any differences existing in the resultant image, thesignificance of the differences in the resultant image with respect tothe potential presence of a chemical species determined usingcorrelation coefficients. In one or more embodiments, subsequentresultant images and associated correlation coefficients may begenerated to provide greater accuracy in the identification of apotential release, decreasing false positives resulting from backgroundand noise interference.

Referring to FIG. 6, a resultant image 605 (e.g., first resultant image)may be formed by comparing image 610 (e.g., a first image) from achemical band EM radiation detector (e.g., the first EM radiationdetector) with image 620 (e.g., a second image) from a reference band EMradiation detector (e.g., the second EM radiation detector). In one ormore embodiments, the images may have been subjected to a differentialimage quality enhancement method, as described herein. In one or moreembodiments, a plurality of resultant images (e.g., a first resultantimage, a second resultant image, a third resultant image, etc.) may beanalyzed. The plurality of resultant images may be formed from aplurality of images from the chemical band EM radiation detector (e.g.,a first image, a third image, a fifth image, etc.) and a plurality ofimages from the reference band EM radiation detector (e.g., a secondimage, a fourth image, a sixth image, etc.). Determining the presence orabsence of a chemical species may be based, at least in part, on one ormore resultant images. A resultant image may be formed in any suitablemanner, for example by determining the differences between intensityvalues of corresponding pixels of an image from a chemical band EMradiation detector and an image from a reference band EM radiationdetector. Differences observed in a resultant image may be considered a“positive” reading, i.e., an indication of the potential presence of achemical species.

In one or more embodiments, the difference in intensity values of aresultant image may be formed by subtracting pixel intensities of animage from a reference band EM radiation detector (e.g., the second EMradiation detector) from pixel intensities of an image from a chemicalband EM radiation detector (e.g., the first EM radiation detector).Subtracting pixel intensities of images yields a differential resultantimage capturing a potential chemical species detected. One or moresubstantially spatially and/or temporally aligned pixels from the images(e.g., the first image and the second image) may be subtracted and theresulting intensity value used for the associated pixel in the resultantimage (e.g., a first resultant image). The difference in intensityvalues in a resultant image may be represented by both the sign and themagnitude or may be absolute values.

In one or more other embodiments, the difference in intensity values ofa resultant image may be determined by calculating the ratio betweenpixel intensities of an image from a reference band EM radiationdetector (e.g., the second EM radiation detector) and pixel intensitiesof an image from a chemical band EM radiation detector (e.g., the firstEM radiation detector). Calculating the ratio of pixel intensities ofimages yields a differential resultant image capturing any potentialchemical species detected. The pixels of the images may be substantiallyspatially and/or temporally aligned. In one or more embodiments, theratio is calculated between a plurality of pixels of an image from achemical band EM radiation detector (e.g., the first EM radiationdetector) and a plurality of pixels of an image from a reference band EMradiation detector (e.g., the second EM radiation detector). The ratiovalues are used to represent the intensity value for resultant pixels ofthe corresponding resultant image.

In one or more embodiments, a resultant threshold criteria may beapplied to the resultant pixel intensity values. At least a portion ofthe resultant pixel values satisfying the resultant threshold criteriamay be grouped into one or more regions of interest. The resultantthreshold criteria includes at least one threshold value. In one or moreembodiments, resultant pixels having an intensity value greater than athreshold value, and optionally additionally having the same sign, maybe considered for inclusion in a region of interest. Taking intoconsideration the sign of the intensity of the resultant pixels may beused to remove resultant pixels from consideration due to low contrast,high noise such as those produced by vegetative backgrounds or highlyreflective surfaces.

In one or more embodiments, the one or more regions of interest may bedetermined by generating multiple resultant images using the same imagesfrom the chemical band EM radiation detector and the reference band EMradiation detector. In one resultant image, the difference in intensityvalues may be determined by subtracting pixel intensities between afirst plurality of pixels (e.g., n₁ to n_(z)) of a first image from achemical band EM radiation detector and a corresponding second pluralityof pixels (e.g., m₁ to m_(z)) of a second image from a reference band EMradiation detector to provide the intensity values for a plurality ofcorresponding plurality of pixels (r₁ to r_(z)) for the first resultantimage. An additional resultant image may be generated using the ratio ofintensity values of the images for the plurality of resultant pixels(e.g., r′₁ to r′_(z)). The resultant threshold criteria may include afirst threshold value to be applied to the resultant pixels (e.g., r₁ tor_(z)) of the resultant image (e.g., the first resultant image) relatingto the subtraction intensity threshold value and a second thresholdvalue to be applied to the resultant pixels (e.g., r′₁ to r′_(z)) of theadditional resultant image (e.g., the another first resultant image)relating to the intensity ratio threshold value. At least a portion ofthe resultant pixels satisfying both the first resultant threshold valueand the second resultant threshold value may be grouped into one or moreregions of interest. In an exemplary embodiment, preliminary thresholdcriteria may be applied to remove pixels having a low intensity value ora high intensity value. The resultant threshold criteria may be selectedto exclude pixels having a resultant pixel intensity value (r₁ to r_(z))that is below the selected differential intensity value for the firstresultant threshold value or select resultant pixel intensity values (r₁to r_(z)) equal to or greater than the selected differential intensityvalue of the first resultant threshold value, and the second resultantthreshold values may be selected to exclude resultant pixel intensityvalues (r′₁ to r′_(z)) within a given range of intensity values orselect resultant pixel intensity values (r′₁ to r′_(z)) outside of therange of intensity values.

For each of the one or more regions of interest identified in aresultant image, correlation coefficients may be determined. Each of theone or more regions of interest includes a subset of the plurality ofpixels of the image. For example, one of the one or more regions mayinclude a first subset of pixels from a plurality of pixels of an imagefrom a chemical band EM radiation detector and a first subset of pixelsfrom a plurality of pixels of an image from a reference band EMradiation detector and a first subset of pixels from a resultant imagegenerated from the images. Another of the one or more regions ofinterest may include a second subset of pixels from the plurality ofpixels of the image from the chemical band EM radiation detector and asecond subset of pixels from the plurality of pixels of the image fromthe reference band EM radiation detector and a second subset of pixelsfrom the resultant image generated from the same images. Additionalregions of interest may include third subsets of pixels, fourth subsetsof pixels, etc. Correlation coefficients (e.g., a first correlationcoefficient, a second correlation coefficient, and a third correlationcoefficient) may be calculated for each of the one or more regions ofinterest using the corresponding subset of pixels of the images. In oneor more embodiments, the one or more regions of interest may besubstantially the same as or different from the one or more areas ofinterest identified for any differential image quality enhancementmethods, if the enhancement method was applied to the images.

A correlation coefficient may be calculated using any suitable method.In one or more embodiments, the correlation coefficients may becalculated using a root mean square (RMS) correlation method todetermine the correlation between corresponding pixel intensities withina region of interest to be correlated (e.g., the first image, the secondimage, and the first resultant image; the third image, the fourth image,and the second resultant image; the fifth image, the sixth image, andthe third resultant image; etc.). In one or more embodiments, aplurality of regions of interest may be identified for analysis in aresultant image. Correlation coefficients for each of the plurality ofregions of interest may be calculated using the intensity values of thecorresponding pixels from an image from the chemical band EM radiationdetector, an image from the reference band EM radiation detector, andthe resultant image, similar to the calculations for the first, second,and third correlation coefficients of the first region of interest.Different subsets of the plurality of pixels corresponding to theregions of interest may be used to determine the correlation betweenimages for the particular region of interest.

In one or more embodiments, correlation coefficient threshold criteriamay be applied to one or more correlation coefficients. The correlationcoefficient threshold criteria may be applied to the first correlationcoefficient, the second correlation coefficient, third correlationcoefficient, etc. If the first correlation coefficient representscorrelation of the pixels above the threshold value within the givenregion of interest and the second correlation coefficient representscorrelation less than the threshold value for the corresponding pixels,a chemical species may be detected. If a third correlation coefficientis calculated for the first and second image, the third correlationcoefficient would represent a correlation less than the threshold valuefor the corresponding pixels if a potential chemical species may bedetected. In one or more embodiments, the correlation coefficientthreshold value may be a value representing at least 85%) correlation,for example at least 90% correlation or at least 95% correlation. Thecorrelation coefficient threshold value may be applied to correlationcoefficients determined for additional regions of interest in the firstimage, the second image, and the first resultant image or to one or moreregions of interest identified in subsequent images obtained from thedetection system (e.g., sequential images or video obtained from thedetection system).

In FIG. 8, a decision matrix is illustrated which may be used in thedetection of a chemical species in accordance with one or moreembodiments of the present disclosure. The decision matrix 800illustrates an image 801 from the chemical band EM radiation detector,an image 802 from the reference band EM radiation detector, and aresultant image 803. Region 835 represents the region within thedecision matrix meeting the criteria, as discussed herein, for thepotential detection of a chemical species. In particular, region 835represents regions of interest which may be classified as detecting apotential chemical species. Region 835 is represented by a greatercorrelation represented by arrow 830 between image 801 and resultantimage 803 for a particular region of interest and a lesser correlationrepresented by arrow 820 between image 802 and resultant image 803 aswell as arrow 810 between image 801 and image 802 for the particularregion of interest. The region 840, outside of region 835, representsregions of interest which may be classified as an interference which areindicated by a lesser correlation represented by arrow 825 between image801 and resultant image 803 and a greater correlation represented byarrow 815 between image 802 and resultant image 803 as well as arrow 805between image 801 and image 802. As discussed herein, thresholds may beused to determine whether there is high correlation or low correlationbetween the images.

In one or more embodiments, a plurality of resultant images may begenerated. For example, a third image from a chemical band EM radiationdetector may be obtained; a corresponding fourth image from a referenceband EM radiation detector may be obtained; and a second resultant imagegenerated. A fourth correlation coefficient may be calculated using theintensity values of the corresponding pixels from the third image andthe second resultant image within a region of interest. A fifthcorrelation coefficient may be calculated using the intensity values ofthe corresponding pixels from the fourth image and the second resultantimage within the region of interest. A sixth correlation coefficient maybe calculated using the intensity values of the corresponding pixelsfrom the third image and the fourth image within the region of interest.The region of interest may include at least a major portion (more than50%) of the corresponding region of interest for the first image, secondimage, and first resultant image. A fifth image from a chemical band EMradiation detector may be obtained, a corresponding sixth image from areference band EM radiation detector may be obtained, and a thirdresultant image generated. A seventh correlation coefficient may becalculated using the intensity values of the corresponding pixels fromthe fifth image and the third resultant image within a region ofinterest. An eighth correlation coefficient may be calculated using theintensity values of the corresponding pixels from the sixth image andthe third resultant image within the region of interest. A ninthcorrelation coefficient may be calculated using the intensity values ofthe corresponding pixels from the fifth image and the sixth image withinthe region of interest. A region of interest may change overtime, forexample due to the expansion of a leak into the environment beingdetected. To associate a region of interest in images over time, a trackmay be established based on one or more of distance matching, sizematching, shape matching, and any combinations thereof. The track isused to identify the same corresponding region of interest in a seriesof images. In one or more embodiments, a subsequent region of interestmay include at least a major portion (more than 50%) of the region ofinterest from previous images (e.g., the first image, the second image,and the first resultant image; the third image, the fourth image, andthe second resultant image; and the fifth image, the sixth image, andthe third resultant image).

In one or more embodiments, a resultant image after analysis may beconverted to a binary image for display to an operator. The binary imagemay be monochromatic. The binary resultant image may show resultantpixels satisfying one or more threshold value or criteria.

In one or more embodiments, a confidence value may be assigned based onthe correlation between a set of images (e.g., the first image, thesecond image, and the first resultant image). The confidence value maybe increased or decreased based on the correlation between subsequentsets of images (e.g., the third image, the fourth image, and the secondresultant image; the fifth image, the sixth image, and the thirdresultant image; etc.). For example, the confidence value may beincreased if the correlation coefficient threshold criteria is satisfiedsuch that the correlation coefficient of a subsequent image from thechemical band EM radiation detector (e.g., the fourth correlationcoefficient, the seventh correlation coefficient, etc.) is greater thanthe correlation coefficient threshold criteria and the correlationcoefficients of corresponding subsequent images from the reference bandEM radiation detector are less than the correlation coefficientthreshold criteria (e.g., the fifth correlation coefficient, the eighthcorrelation coefficient, etc., between the image from the reference bandEM radiation detector and the corresponding resultant image; the sixthcorrelation coefficient, the ninth correlation coefficient, etc.,between the image from the chemical band EM radiation detector and thereference band EM radiation detector). A confidence value thresholdcriteria may be applied to the confidence value. If the confidence valueis greater than the confidence value threshold criteria, an alert may begenerated.

FIG. 7 illustrates flow chart for a method of detecting a chemicalspecies using a detection system including multiple EM radiationdetectors in accordance with one or more embodiments of the presentdisclosure. The detection method 700 begins at block 705. A beam of EMradiation is split into a plurality of beams (e.g., a first EM radiationbeam and a second EM radiation beam) at block 710. At least a portion ofone of the plurality of beams (e.g., the first EM radiation beam) ispassed through a chemical band filter (e.g., a first bandpass filter)forming a filtered chemical band EM radiation beam (e.g., a filteredfirst EM radiation beam) at block 720 and at least a portion of anotherof the plurality of EM radiation beams (e.g., the second EM radiationbeam) is passed through a reference bandpass filter (e.g., a secondbandpass filter) forming a filtered reference band EM radiation beam(e.g., a filtered second EM radiation beam) at block 730. At least aportion of the filtered chemical band EM radiation beam (e.g., thefiltered first EM radiation beam) is received by the chemical band EMradiation detector (e.g., the first EM radiation detector) at block 740and at least a portion of the filtered reference band EM radiation beam(e.g., the filtered second EM radiation beam) is received by thereference band EM radiation detector (e.g., the second EM radiationdetector) at block 750.

At block 760, an image is obtained from the chemical band EM radiationdetector (e.g., the first EM radiation detector). At block 765, an imageis obtained from a reference band EM radiation detector (e.g., thesecond EM radiation detector). At block 770, a resultant image (e.g., afirst resultant image) is generated based on the chemical band image(e.g., a first image, a third image, a fifth image, etc.) and thereference band image (e.g., a second image, a fourth image, a sixthimage, etc.). The resultant image is based, at least in part, on thedata generated by the chemical band and reference band detectors (e.g.,the first and second EM radiation detectors) according to one or moreembodiments described herein. At block 775, one or more regions ofinterest are identified. At block 780, correlation coefficients aredetermined for at least one of the regions of interest. At block 785,the presence or absence of a chemical species is determined based, atleast in part, on the correlation coefficients according to one or moreembodiments described herein. If additional detection is desired, themethod returns to block 710. If no additional detection is desired, themethod may end at block 790.

The detectors may be configured to generate a single image, a series ofstill images, or video images upon a command received from a computersystem, at least a portion of which may be used to generate resultantimages. A plurality of images may be generated to enhance the imagequality, provide greater accuracy in the identification of a potentialrelease, and decrease false positives resulting from background andnoise interference.

A number of variations to the detection analysis techniques disclosedherein may be used to improve the reliability, ease of use, or ease ofimplementation of the detection system. In one or more embodiments, leakmodeling results, leak detection criteria, camera and lenscharacteristics, and algorithm requirements may be combined to formdeployment reference charts for setting up an autonomous detectionsystem.

In one or more embodiments, additional detection analysis methods may beutilized to enhance the determination of the presence or absence of achemical species and/or to increase the accuracy of the analysis. Theadditional detection analysis methods may be applied to chemical bandimages, reference band images, resultant images, and any combinationsthereof Additional analysis methods are described herein and furtherdescribed in U.S. Patent Publication No. 2014/0002639 and U.S. PatentPublication No. 2014/0002667, which are incorporated herein by referencein their entirety.

Image analysis methods may use an algorithm to further analyze theimages to distinguish chemical species (e.g., a gaseous plume of achemical species) from other features in an image to improve accuracyand decrease the probability of false alarms. The algorithm may furtherdistinguish the chemical species, such as hydrocarbon gas or vapor, fromother ambient factors, such as water flows, steam plumes, furnace offgases, vehicles, persons, wildlife, and the like. In addition to usingresultant images to determine the presence of a chemical species,enhanced identification techniques may be used. Such enhancedidentification techniques may include analyzing for features such asdeterministic features, probabilistic features, auxiliary features, andany combinations thereof. The image(s) may be in color or in grayscale,in which the difference in contrast may be used to identify features.

An additional detection analysis method may include analyzing for adeterministic feature. Deterministic features may include both spatialand kinematic features, among others. For example, the additionalanalysis method may determine geometric features, including the shape ofa chemical plume and/or the size of a chemical plume, among others. Theanalysis may also determine shape constraints such as aspect ratio,dispersiveness (e.g., the thickness of the plume as a function ofdistance), convexity, and histogram of orientation gradient (HOG) ofcontour, among others. These features serve as constraints and providescreening of the potential regions which may represent a chemicalspecies.

Kinematic or motion features may include determining that a plume isconstantly moving but that the motion is restricted to a constrainedarea, as may be expected by a plume originating from a leak. Kinematicfeatures may include size constraints of a plume, such as a minimal andmaximal size through a sequence of images. The kinematic features may beused to filter out most rigid body interferences.

Probabilistic features may include a spatial pattern of the chemicalplume, a temporal pattern of the chemical plume, or any number of otherfeatures. The additional analysis method may include joint spatial andtemporal analyses such as a fast dynamic texture algorithm. In theprobabilistic analysis, a statistical model described by two types ofequations, e.g., evolution equations and observation equations, whichrespectively model the way the intrinsic state evolves with time and theway the intrinsic state projects to image pixels, may be fitted to thesegmented pixel data. Parameters may be estimated by matrices. Otherprobabilistic analysis techniques may also be used, such as principalcomponent analysis (PCA). In PCA, a determination of the variablescausing changes to a plume is made, such as a statistical comparison ofwind speed and direction with changes seen in plumes.

Auxiliary features may include comparing images visible to the human eyeto the plume identified using the non-visible images, such as images inthe IR spectrum. For example, the visible images may be used todifferentiate organic vapor plumes and water steam. Generally, organicplumes may be dark in the non-visible images and not very visible in thevisible images. In contrast, a steam plume may be bright in thenon-visible images, due to emitted heat, and visible in the visibleimages. In addition to improving the detection, the visible images maybe used to locate the leak in the plant environment, for example, bycomparing a registered image from a detector in the infrared spectrumwith an overlapping image from a detector in the visible spectrum.

The detection and confirmation of plumes may be enhanced bymeteorological measurements collected by a meteorological monitor. Themeteorological monitor may collect data on environmental conditions suchas wind speed, temperature, precipitation, atmospheric haze, and thelike. This data may then be used in one or more embodiments to confirmthat a detected plume is consistent with the collected data. Forexample, the calculated motion of the plume may be compared with thewind direction, such as in a PCA algorithm. If the motion of the plumeis inconsistent with the wind direction, the plume identification may beincorrect.

The code of the analysis system may be further configured to direct theprocessor to provide additional detection analysis, for exampleconfigured to direct the processor to analyze one or more images (e.g.,chemical band images, reference band images, resultant images, and anycombinations thereof) for deterministic features, probabilisticfeatures, auxiliary features, and any combinations thereof.

In one or more embodiments, the detection reliability and/or accuracymay also be improved by utilizing chemical markers in varioushydrocarbon streams. The chemical markers may be substances added toincrease an absorbance or emission at a particular wavelength. Suchmarkers may make the use of other detection techniques more effective.For example, fluorescent chemicals may be added to a hydrocarbon streamin very small amounts, such as a few parts-per-million, as thesecompounds often have a high quantum yield, which is the number ofphotons emitted divided by the number of photons absorbed. As thewavelength of light emitted may not overlap with natural sources, theidentification of a plume from the fluorescence may be straightforward.

In one or more embodiments, EM radiation detectors having different bitdepths and dynamic intensity ranges may be used. In such situations, thevalues applied to pixels of one of the EM radiation detectors may beadjusted proportionally.

It should be understood that the preceding is merely a detaileddescription of specific embodiments of the invention and that numerouschanges, modifications, and alternatives to the disclosed embodimentscan be made in accordance with the disclosure here without departingfrom the scope of the invention. Although the detection system may bedescribed herein with reference to a first, chemical band EM radiationdetector and a second, reference band EM radiation detector, one skilledin the art in light of the present disclosure will appreciate that anynumber of additional detectors may be used with the detection systemdescribed herein. The preceding description, therefore, is not meant tolimit the scope of the invention. Rather, the scope of the invention isto be determined only by the appended claims and their equivalents. Itis also contemplated that structures and features embodied in thepresent examples can be altered, rearranged, substituted, deleted,duplicated, combined, or added to each other. The articles “the”, “a”and “an” are not necessarily limited to mean only one, but rather areinclusive and open-ended so as to include, optionally, multiple suchelements.

What is claimed is:
 1. A system for detecting at least one chemicalspecies released into an environment, comprising: a lens; a first beamsplitter configured to receive a beam of electromagnetic radiation fromthe lens and separate the beam into a first electromagnetic radiationbeam and a second electromagnetic radiation beam; a first bandpassfilter configured to receive the first electromagnetic radiation beamand transmit a filtered first electromagnetic radiation beam in amid-infrared spectral range, the first bandpass filter is configured totransmit at least 50% of the first electromagnetic radiation beampassing through a first transmittance window, the first transmittancewindow having a first width including a first electromagnetic radiationwavelength range corresponding to at least a portion of a wavelengthrange of absorption or emission by the at least one chemical species tobe detected; a first electromagnetic radiation detector configured toreceive at least a portion of the filtered first electromagneticradiation beam from the first bandpass filter and detect the at leastone chemical species; a second bandpass filter configured to receive thesecond electromagnetic radiation beam and transmit a filtered secondelectromagnetic radiation beam in the mid-infrared spectral range, thesecond bandpass filter including a second transmittance window having asecond width within a second electromagnetic radiation wavelength, thesecond width in the range of from 50 nm to 500 nm, the secondtransmittance window having an upper limit wavelength value that isgreater than an upper limit wavelength value of the first transmittancewindow, the second bandpass filter configured to transmit a lesserpercentage of the second electromagnetic radiation beam passing throughthe second transmittance window than the first bandpass filter transmitsof the first electromagnetic radiation beam passing through the firsttransmittance window; and a second electromagnetic radiation detectorconfigured to receive at least a portion of the filtered secondelectromagnetic radiation beam from the second bandpass filter andprovide a reference background.
 2. The system of claim 1 furthercomprising an analysis system including code within a processor, anon-transitory, computer-readable medium, or a combination thereof, thecode configured to direct the processor to: identify at least one imagefrom the first electromagnetic radiation detector and at least one imagefrom the second electromagnetic radiation detector; compare the at leastone image from the first electromagnetic radiation detector with the atleast one image from the second electromagnetic radiation detector; anddetermine if a difference between the images represents the detection ofa chemical species.
 3. The system of claim 1, wherein the secondbandpass filter transmits at most 45% of the filtered secondelectromagnetic radiation beam within the second transmittance window.4. The system of claim 1, wherein the second bandpass filter transmitsat most 35% of the filtered second electromagnetic radiation beam withinthe second transmittance window.
 5. The system of claim 1, wherein thesecond bandpass filter transmits at most 25% of the filtered secondelectromagnetic radiation beam within the second transmittance window.6. The system of claim 5, wherein the first bandpass filter transmits atleast 90% of the filtered first electromagnetic radiation beam withinthe first transmittance window.
 7. The system of claim 1, wherein thesecond transmittance window width is greater than the firsttransmittance window width.
 8. The system of claim 1, wherein the lowerlimit wavelength value of the second transmittance window is greaterthan the upper limit wavelength value of the first transmittance window.9. The system of claim 8, wherein the lower limit wavelength value ofthe second transmittance window is at least 100 nm greater than theupper limit wavelength value of the first transmittance window.
 10. Thesystem of claim 1, wherein the first transmittance window width is inthe range of from 50 nm to 250 nm.
 11. The system of claim 1, whereinthe second transmittance window width is in the range of from 50 nm to200 nm.
 12. The system of claim 1, wherein a lower limit wavelengthvalue of the first transmittance window is at least 3 microns and theupper limit wavelength value of the first transmittance window is atmost 3.5 microns.
 13. The system of claim 12, wherein a lower limitwavelength value of the second transmittance window is at least 3.7microns and the upper limit wavelength value of the second transmittancewindow is at most 4.5 microns.
 14. A method of detecting at least onechemical species released into an environment comprising: splitting abeam of electromagnetic radiation into at least a first electromagneticradiation beam and a second electromagnetic radiation beam; passing atleast a portion of the first electromagnetic radiation beam through afirst bandpass filter, wherein the first bandpass filter is configuredto receive the first electromagnetic radiation beam and transmit afiltered first electromagnetic radiation beam in a mid-infrared spectralrange, the first bandpass filter transmits at least 50% of the firstelectromagnetic radiation beam passing through a first transmittancewindow, the first transmittance window having a first width including afirst electromagnetic radiation wavelength range corresponding to atleast a portion of a wavelength range of absorption or emission by theat least one chemical species to be detected; passing at least a portionof the second electromagnetic radiation beam through a second bandpassfilter, wherein the second bandpass filter is configured to receive thesecond electromagnetic radiation beam and transmit a filtered secondelectromagnetic radiation beam in the mid-infrared spectral range, andwherein the second bandpass filter includes a second transmittancewindow having a second width within a second electromagnetic radiationwavelength range, the second width in a range of from 50 nm to 500 nm,the second transmittance window having an upper limit wavelength valuethat is greater than an upper limit wavelength value of the firsttransmittance window, and wherein the second bandpass filter transmits alesser percentage of the second electromagnetic radiation beam passingthrough the second transmittance window than the first bandpass filtertransmits of the first electromagnetic radiation beam passing throughthe first transmittance window; receiving at least a portion of thefiltered first electromagnetic radiation beam with a firstelectromagnetic radiation detector configured to detect the at least onechemical species; receiving at least a portion of the filtered secondelectromagnetic radiation beam with a second electromagnetic radiationdetector configured to provide a reference background; generating atleast one image of the filtered first electromagnetic radiation beamdetected by the first electromagnetic radiation detector and at leastone image of the filtered second electromagnetic radiation beam detectedby the second electromagnetic radiation detector; and determining thepresence of the at least one chemical species based, at least in part,on the images.
 15. The method of claim 14 further comprising generatinga resultant image from the at least one image from the firstelectromagnetic radiation detector and the at least one image from thesecond electromagnetic radiation detector.
 16. The method of claim 14,wherein a first plurality of images from the first electromagneticradiation detector and a second plurality of images from the secondelectromagnetic radiation detector are generated; and the presence of atleast one chemical species is determined based, at least in part, on thefirst plurality of images and the second plurality of images.
 17. Themethod of claim 16, further comprising generating a plurality ofresultant images from the first plurality of images from the firstelectromagnetic radiation detector and the second plurality of imagesfrom the second electromagnetic radiation detector and determining thepresence of the at least one chemical species based, at least in part,on the plurality of resultant images.
 18. The method of claim 14,wherein the second bandpass filter transmits at most 45% of the filteredsecond electromagnetic radiation beam within the second transmittancewindow, the first bandpass filter transmits at least 80% of the filteredfirst electromagnetic radiation beam within the first transmittancewindow.
 19. The method of claim 14, wherein the second bandpass filtertransmits at most 30% of the filtered second electromagnetic radiationbeam within the second transmittance window, the first bandpass filtertransmits at least 90% of the filtered first electromagnetic radiationbeam within the first transmittance window.
 20. The method of claim 18,wherein a lower limit wavelength value of the first transmittance windowis at least 3 microns and the upper limit wavelength value of the firsttransmittance window is at most 3.5 microns, and wherein a lower limitwavelength value of the second transmittance window is at least 3.7microns and the upper limit wavelength value of the second transmittancewindow is at most 4.5 microns.
 21. A system for detecting at least onechemical species released into an environment, comprising: a lens; afirst beam splitter configured to receive a beam of electromagneticradiation from the lens and separate the beam into a firstelectromagnetic radiation beam and a second electromagnetic radiationbeam; a first bandpass filter configured to receive the firstelectromagnetic radiation beam and transmit a filtered firstelectromagnetic radiation beam in a mid-infrared spectral range, thefirst bandpass filter is configured to transmit at least 80% of thefirst electromagnetic radiation beam passing through a firsttransmittance window, the first transmittance window having a firstwidth including a first electromagnetic radiation wavelength rangecorresponding to at least a portion of a wavelength range of absorptionor emission by the at least one chemical species to be detected; a firstelectromagnetic radiation detector configured to receive at least aportion of the filtered first electromagnetic radiation beam from thefirst bandpass filter and detect the at least one chemical species; asecond bandpass filter configured to receive the second electromagneticradiation beam and transmit a filtered second electromagnetic radiationbeam in the mid-infrared spectral range, the second bandpass filterincluding a second transmittance window having a second width within asecond electromagnetic radiation wavelength range in the range of from50 nm to 300 nm, the second transmittance window having an upper limitwavelength value that is greater than an upper limit wavelength value ofthe first transmittance window, the second bandpass filter configured totransmit at most 35% of the second electromagnetic radiation beampassing through the second transmittance window; and a secondelectromagnetic radiation detector configured to receive at least aportion of the filtered second electromagnetic radiation beam from thesecond bandpass filter and provide a reference background.